Advances in Imaging and Electron Physics
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9780128152171

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Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools ✶ ✶Reprinted from Advances in Optical and Electron Microscopy, vol. 13, 1994, 123–242.

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2017.12.001 ◽

2018 ◽

pp. 139-267

Author(s):

Erich Plies

Keyword(s):

Electron Microscopy ◽

Electron Beam ◽

Low Voltage ◽

Electron Optics ◽

Simulation Tools ◽

Optical And Electron Microscopy ◽

Voltage Electron

Copyright

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(18)30007-7 ◽

2018 ◽

pp. iv

Index

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(18)30011-9 ◽

2018 ◽

pp. 269-273

Series Editor

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(18)30005-3 ◽

2018 ◽

pp. ii

Keyword(s):

Series Editor

Contributors

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(18)30009-0 ◽

2018 ◽

pp. vii

Preface

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(18)30010-7 ◽

2018 ◽

pp. ix-xi

Author(s):

Peter W. Hawkes

The Early Electron Microscopes: A Critical Study ✶ ✶This article represents two chapters from the draft doctoral thesis of the late John van Gorkom. See Appendix B. E-mail for correspondence: [email protected].

Advances in Imaging and Electron Physics ◽

10.1016/bs.aiep.2018.01.001 ◽

2018 ◽

pp. 1-137 ◽

Cited By ~ 5

Author(s):

John van Gorkom ◽

Dirk van Delft ◽

Ton van Helvoort

Keyword(s):

Critical Study ◽

Doctoral Thesis ◽

Electron Microscopes ◽

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