Advances in X-Ray Analysis
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81

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4

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Published By Springer US

9781475791129, 9781475791105

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Simultaneous Thermal and Structural Measurements of Oriented Polymers by DSC/XRD Using an Area Detector

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_76 ◽

1989 ◽

pp. 617-623

Author(s):

Steven T. Correale ◽

N. Sanjeeva Murthy

Keyword(s):

Oriented Polymers ◽

Area Detector

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The Determination of α-Cristobalite in Airborne Dust by X-Ray Diffraction — Theory and Practice

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_72 ◽

1989 ◽

pp. 585-592

Author(s):

M. Jeyaratnam ◽

N. G. West

Keyword(s):

Diffraction Theory ◽

Theory And Practice ◽

X Ray Diffraction ◽

Airborne Dust ◽

X Ray

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Specific Data Handling Techniques and New Enhancements in a Search/Match Program

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_64 ◽

1989 ◽

pp. 531-538 ◽

Cited By ~ 1

Author(s):

P. Caussin ◽

J. Nusinovici ◽

D. W. Beard

Keyword(s):

Data Handling ◽

Specific Data

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The Crystal Structures of the Cubic and Tetragonal Phases of Y1Ba3Cu2O6.5+δ and Y1Ba4Cu2O7.5+δ

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_60 ◽

1989 ◽

pp. 497-505 ◽

Cited By ~ 2

Author(s):

M. A. Rodriguez ◽

J. J. Simmins ◽

P. H. McCluskey ◽

R. S. Zhou ◽

R. L. Snyder

Keyword(s):

Crystal Structures

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On-Stream XRF Measuring System for Ore Slurry Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_6 ◽

1989 ◽

pp. 45-47

Author(s):

B. Holyńska ◽

M. Lankosz ◽

J. Ostachowicz ◽

T. Wesołowski ◽

J. Zalewski

Keyword(s):

Measuring System

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Residual Stresses Near SCC Fracture Surfaces of AISI 4340 Steel

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_55 ◽

1989 ◽

pp. 451-458 ◽

Cited By ~ 3

Author(s):

Zenjiro Yajima ◽

Masaaki Tsuda ◽

Yukio Hirose ◽

Keisuke Tanaka

Keyword(s):

Residual Stresses ◽

Aisi 4340 Steel ◽

Fracture Surfaces ◽

4340 Steel ◽

Aisi 4340

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X-Ray Diffractometric Determination of Lattice Misfit Between γ and γ’ Phases in Ni-Base Superalloys

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_45 ◽

1989 ◽

pp. 365-375

Author(s):

Katsumi Ohno ◽

Hirosi Harada ◽

Toshihiro Yamagata ◽

Michio Yamazaki ◽

Kazumasa Ohsumi

Keyword(s):

Lattice Misfit ◽

X Ray

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Density Measurement of Thin Sputtered Carbon Films

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_41 ◽

1989 ◽

pp. 323-330

Author(s):

G. L. Gorman ◽

M.-M. Chen ◽

G. Castillo ◽

R. C. C. Perera

Keyword(s):

Density Measurement ◽

Carbon Films

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X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_39 ◽

1989 ◽

pp. 303-310

Author(s):

T. Paul Adl ◽

H. F. Stehmeyer

Keyword(s):

Oxide Films ◽

X Ray Diffraction ◽

X Ray ◽

Thin Oxide Films ◽

Thin Oxide

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Texture Analysis of Thin Films and Surface Layers by Low Incidence Angle X-Ray Diffraction

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_37 ◽

1989 ◽

pp. 285-292

Author(s):

J. J. Heizmann ◽

A. Vadon ◽

D. Schlatter ◽

J. Bessières

Keyword(s):

Thin Films ◽

Texture Analysis ◽

Incidence Angle ◽

X Ray Diffraction ◽

Surface Layers ◽

X Ray ◽

Low Incidence

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