X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins

1989 ◽  
pp. 303-310
Author(s):  
T. Paul Adl ◽  
H. F. Stehmeyer
Keyword(s):  
Oxide Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Oxide Films ◽  
Thin Oxide

X-ray Diffraction of Thin Oxide Films on Soldered Module Pins

1988 ◽  
Vol 32 ◽  
pp. 303-310
Author(s):  
T. Paul Adi ◽  
H. F. Stehmeyer
Keyword(s):  
Oxide Films ◽  
Interplanar Distance ◽  
X Ray Diffraction ◽  
Metal Oxide Films ◽  
X Ray ◽  
Highly Sensitive ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Diffraction Patterns

AbstractThe presence of metal oxide films from wave solder baths on timed module pins are partly responsible for non-wet problems in subsequent soldering steps. The cylindrical geometry of the pins lends itself to the characterization of thin oxide films by using the highly sensitive Debye-Scherrer camera method. As confirmed by Electron Hicroprobe Analysis (EMA), pins containing thin oxide films were used to obtain the diffraction patterns. A software program was developed that subtracts the diffraction angles of an oxids-free control pin from the pattern of the contaminated pin, and tabulates the residual d-spacing (interplanar distance) of the contaminant film.

scholarly journals A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction

2014 ◽  
Vol 47 (2) ◽  
pp. 575-583 ◽  
Author(s):  
Alistair Garner ◽  
Michael Preuss ◽  
Philipp Frankel
Keyword(s):  
Oxide Films ◽  
X Ray Diffraction ◽  
Aqueous Corrosion ◽  
Texture Measurement ◽  
X Ray ◽  
Peak Broadening ◽  
Glancing Angle ◽  
Thin Oxide Films ◽  
Diffraction Peaks ◽  
Thin Oxide

The present article describes a modification to the standard method of glancing-angle X-ray diffraction for accurate measurement of the texture of thin oxide films. The technique resolves the problems caused by overlapping diffraction peaks originating from multiphase materials with asymmetric unit cells and the peak broadening associated with sample tilt during glancing-angle texture measurement. The entire 2θ range of interest is recorded as a function of sample orientation, and the integrated intensities from different crystallographic planes are extracted from fitted diffraction profiles. The technique allows for pole figures to be plotted from diffraction peaks that could otherwise not be resolved and separates contributions from neighbouring peaks, leading to a more accurate representation of the existing oxide texture. The proposed method has been used for determining texture in a 3 µm layer of monoclinic/tetragonal zirconium oxide grown during aqueous corrosion testing and has been verified by additional synchrotron X-ray diffraction measurements.

scholarly journals Application of X-rays Diffraction for Identifying Thin Oxide Surface Layers on Zinc Coatings

Coatings ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 1005
Author(s):  
George Vourlias
Keyword(s):  
Grazing Incidence ◽  
Oxide Surface ◽  
Zinc Oxide Film ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Predicted Values ◽  
Zinc Coatings

Structural characterization of compound material coatings is usually achieved using time-consuming and destructive techniques such as optical and electrical microscopy, which require the use of grinding processes not always compatible with the material. This paper reports on the effective use of a theoretical model based on X-ray diffraction to calculate the thickness and composition of thin oxide films formed on the surface of zinc coatings. Zinc coatings are widely used in industrial application as protective layers against the atmospheric corrosion of steel substrates. The thickness of single- and multi-layer coatings is estimated using grazing incidence X-ray diffraction and various incidence angles. The coatings were grown using hot-dip, pack cementation and thermal spray techniques, and their experimental characteristics were compared to the theoretically predicted values of thickness and composition. The results indicate the formation of a thin zinc oxide film on top of each coating, which acts as an isolation layer and protects the surface of the sample against the environmental corrosion. Finally, the penetration depth of the X-rays into the zinc-based coatings for grazing incidence and Bragg–Brentano X-ray diffraction geometries were calculated using theoretical equations and experimentally confirmed.

Quantitative X‐Ray Emission Analysis of Thin Oxide Films on Tantalum

1971 ◽  
Vol 42 (13) ◽  
pp. 5879-5882 ◽  
Author(s):  
P. B. Sewell ◽  
D. F. Mitchell
Keyword(s):  
Oxide Films ◽  
Emission Analysis ◽  
X Ray ◽  
Thin Oxide Films ◽  
Thin Oxide

scholarly journals X-Ray Absorption Spectroscopy Studies of Electrochemically Deposited Thin Oxide Films

1998 ◽  
Vol 524 ◽  
Author(s):  
M. Balasubramanian ◽  
C. A. Melendres ◽  
A. N. Mansour ◽  
S. Mini
Keyword(s):  
Structural Information ◽  
Oxide Films ◽  
Ferroelectric Materials ◽  
Graphite Substrate ◽  
X Ray ◽  
Electrochemically Deposited ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Spectroscopy Studies ◽  
X Ray Absorption

ABSTRACTWe have utilized “in situ” X-ray Absorption Fine Structure Spectroscopy to investigate the structure and composition of thin oxide films of nickel and iron that have been prepared by electrodeposition on a graphite substrate from aqueous solutions. The films are generally disordered. Structural information has been obtained from the analysis of the data. We also present initial findings on the local structure of heavy metal ions, e.g. Sr and Ce, incorporated into the electrodeposited nickel oxide films. Our results are of importance in a number of technological applications, among them, batteries, fuel cells, electrochromic and ferroelectric materials, corrosion protection, as well as environmental speciation and remediation.

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