Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Latest Publications

TOTAL DOCUMENTS

10

(FIVE YEARS 0)

H-INDEX

1

(FIVE YEARS 0)

Published By Springer US

9780792379911, 9780306470400

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Analog Test Bus Standard

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_17 ◽

2002 ◽

pp. 575-593

Keyword(s):

Download Full-text

Memory Test

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_9 ◽

2002 ◽

pp. 253-308

Keyword(s):

Download Full-text

The Future of Testing

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_19 ◽

2002 ◽

pp. 613-614

Keyword(s):

Download Full-text

Delay Test

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_12 ◽

2002 ◽

pp. 417-438

Keyword(s):

Download Full-text

Test Economics and Product Quality

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_3 ◽

2002 ◽

pp. 35-55

Keyword(s):

Product Quality ◽

Download Full-text

Introduction

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_1 ◽

2002 ◽

pp. 3-16

Download Full-text

Combinational Circuit Test Generation

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_7 ◽

2002 ◽

pp. 155-210

Keyword(s):

Test Generation ◽

Combinational Circuit

Download Full-text

Logic and Fault Simulation

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_5 ◽

2002 ◽

pp. 83-128

Keyword(s):

Fault Simulation

Download Full-text

DSP-Based Analog and Mixed-Signal Test

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_10 ◽

2002 ◽

pp. 309-384

Keyword(s):

Download Full-text

Built-In Self-Test

Frontiers in Electronic Testing - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits ◽

10.1007/0-306-47040-3_15 ◽

2002 ◽

pp. 489-548 ◽

Keyword(s):

Self Test ◽

Built In Self Test

Download Full-text