test economics
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Test Economics

WSPC Series in Advanced Integration and Packaging - Cost Analysis of Electronic Systems ◽

10.1142/9789813148260_0007 ◽

2016 ◽

pp. 113-154

Author(s):

Peter Sandborn

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TEST ECONOMICS

Cost Analysis of Electronic Systems ◽

10.1142/9789814383356_0007 ◽

2012 ◽

pp. 101-139

Author(s):

Peter Sandborn

Keyword(s):

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Test economics for homogeneous manycore systems

2009 International Test Conference ◽

10.1109/test.2009.5355748 ◽

2009 ◽

Author(s):

Lin Huang ◽

Qiang Xu

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Behavioral Test Economics

2006 IEEE International Test Conference ◽

10.1109/test.2006.297651 ◽

2006 ◽

Author(s):

Scott Davidson ◽

Anthony Ambler ◽

Helen Davidson

Keyword(s):

Behavioral Test ◽

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Test Economics ¿ What can a Board/System Test Engineer do to Influence Supply Operation Metrics

2006 IEEE International Test Conference ◽

10.1109/test.2006.297650 ◽

2006 ◽

Author(s):

Sylvain Tourangeau ◽

Bill Eklow

Keyword(s):

Test Economics ◽

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Test Economics

Integrated Circuit Test Engineering ◽

10.1007/1-84628-173-3_12 ◽

2005 ◽

pp. 267-274

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Test economics for multi-site test with modern cost reduction techniques

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) ◽

10.1109/vts.2002.1011173 ◽

2003 ◽

Author(s):

E.H. Volkerink ◽

A. Khoche ◽

J. Rivoir ◽

K.D. Hilliges

Keyword(s):

Cost Reduction ◽

Test Economics ◽

Reduction Techniques ◽

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Applications of semiconductor test economics, and multisite testing to lower cost of test

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) ◽

10.1109/test.1999.805620 ◽

2003 ◽

Author(s):

A.C. Evans

Keyword(s):

Semiconductor Test ◽

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Considering test economics in the process of hardware/software partitioning

Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies ◽

10.1109/eurmic.1996.546362 ◽

2002 ◽

Author(s):

G. Al-Hayek ◽

Y. Le-Traon ◽

C. Robach

Keyword(s):

Test Economics ◽

Software Partitioning

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Integrated test solutions and test economics for MCMs

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529833 ◽

2002 ◽

Author(s):

K.T. Kornegay ◽

K. Roy

Keyword(s):

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