2014 IEEE 23rd Asian Test Symposium
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9781479960309
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Methodology for Early RTL Testability and Coverage Analysis and Its Application to Industrial Designs

2014 ◽  
Author(s):  
Chandan Kumar ◽  
Fadi Maamari ◽  
Kiran Vittal ◽  
Wilson Pradeep ◽  
Rajesh Tiwari ◽  
...  
Keyword(s):  
Coverage Analysis

On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test

2014 ◽  
Author(s):  
Guillaume Renaud ◽  
Manuel J. Barragan ◽  
Salvador Mir ◽  
Marc Sabut
Keyword(s):  
Servo Loop ◽  
On Chip ◽  
Linearity Test

Low Power Test Compression with Programmable Broadcast-Based Control

2014 ◽  
Author(s):  
Sylwester Milewski ◽  
Grzegorz Mrugalski ◽  
Janusz Rajski ◽  
Jerzy Tyszer
Keyword(s):  
Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test

An On-Chip Digital Environment Monitor for Field Test

2014 ◽  
Author(s):  
Seiji Kajihara ◽  
Yousuke Miyake ◽  
Yasuo Sato ◽  
Yukiya Miura
Keyword(s):  
Field Test ◽  
Digital Environment ◽  
On Chip

Advanced Analysis of Cell Stability for Reliable SRAM PUFs

2014 ◽  
Author(s):  
Alison Hosey ◽  
Md. Tauhidur Rahman ◽  
Kan Xiao ◽  
Domenic Forte ◽  
Mohammad Tehranipoor
Keyword(s):  
Cell Stability ◽  
Advanced Analysis

A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System

2014 ◽  
Author(s):  
Taewoo Han ◽  
Inhyuk Choi ◽  
Hyunggoy Oh ◽  
Sungho Kang
Keyword(s):  
Parallel Test ◽  
Multicore System

Testing of Non-volatile Logic-Based System Chips

2014 ◽  
Author(s):  
Yong-Xiao Chen ◽  
Jin-Fu Li

Optimal Redundancy Designs for CNFET-Based Circuits

2014 ◽  
Author(s):  
Da Cheng ◽  
Fangzhou Wang ◽  
Feng Gao ◽  
Sandeep K. Gupta

Keynote

2014 ◽  
Author(s):  
Shawn Blanton
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