2020 IEEE Latin-American Test Symposium (LATS)
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28
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1
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Published By IEEE

9781728187310
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Wafer-Level Die Re-Test Success Prediction Using Machine Learning

2020 ◽  
Author(s):  
Hardi Selg ◽  
Maksim Jenihhin ◽  
Peeter Ellervee
Keyword(s):  
Machine Learning ◽  
Success Prediction ◽  
Wafer Level

Resistance of the Montgomery kP Algorithm against Simple SCA: Theory and Practice

2020 ◽  
Author(s):  
Ievgen Kabin ◽  
Zoya Dyka ◽  
Marcin Aftowicz ◽  
Dan Klann ◽  
Peter Langendoerfer
Keyword(s):  
Theory And Practice

scholarly journals Evaluating Software-based Hardening Techniques for General-Purpose Registers on a GPGPU

2020 ◽  
Author(s):  
Marcio M. Goncalves ◽  
Jose Rodrigo Azambuja ◽  
Josie E. R. Condia ◽  
Matteo Sonza Reorda ◽  
Luca Sterpone
Keyword(s):  
General Purpose

Soft Error Reliability of SRAM cells during the three operation states

2020 ◽  
Author(s):  
Cleiton M. Marques ◽  
Cristina Meinhardt ◽  
Paulo F. Butzen
Keyword(s):  
Soft Error

scholarly journals Implementing indirect test of RF circuits without compromising test quality: a practical case study

2020 ◽  
Author(s):  
H. El Badawi ◽  
F. Azais ◽  
S. Bernard ◽  
M. Comte ◽  
V. Kerzerho ◽  
...  
Keyword(s):  
Rf Circuits ◽  
Practical Case ◽  
Indirect Test ◽  
Test Quality

scholarly journals Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

2020 ◽  
Author(s):  
Thiago Copetti ◽  
Guilherme Cardoso Medeiros ◽  
Mottaqiallah Taouil ◽  
Said Hamdioui ◽  
Leticia Bolzani Poehls ◽  
...  
Keyword(s):  
The Impact ◽  
Resistive Defects

At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDes

2020 ◽  
Author(s):  
Salem Abdennadher ◽  
Kyle Tripician ◽  
Senthil Singaravelu
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