Records of the 1993 IEEE International Workshop on Memory Testing
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE Comput. Soc. Press

0818641509

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A 20 MHz test vector generator for producing tests that detect single 4- and 5-coupling faults in RAMs

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263157 ◽

2002 ◽

Cited By ~ 5

Author(s):

B.F. Cockburn

Keyword(s):

Test Vector ◽

Coupling Faults ◽

Test Vector Generator

Key attributes of an SRAM testing strategy required for effective process monitoring

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263144 ◽

2002 ◽

Cited By ~ 11

Author(s):

J. Khare ◽

S. Griep ◽

H.-D. Oberle ◽

W. Maly ◽

D. Schmitt-Landsiedel ◽

...

Keyword(s):

Process Monitoring ◽

Testing Strategy

A high-speed boundary search Shmoo plot for ULSI memories

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263158 ◽

2002 ◽

Cited By ~ 3

Author(s):

M. Hamada ◽

M. Kumanoya ◽

M. Ishii ◽

T. Kawagoe ◽

M. Niiro

Keyword(s):

High Speed

Fault location algorithms for repairable embedded RAMs

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263149 ◽

2002 ◽

Author(s):

R. Treuer ◽

V.K. Agarwal

Keyword(s):

Fault Location

Modeling of faulty behavior of ECL storage elements

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263153 ◽

2002 ◽

Cited By ~ 2

Author(s):

S.M. Menon ◽

Y.K. Malaiya ◽

A.P. Jayasumana

Are NV-memories non-volatile?

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263141 ◽

2002 ◽

Cited By ~ 1

Author(s):

D. Ratchev

Effective tests for memories based on faults models for low PPM defects

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263142 ◽

2002 ◽

Cited By ~ 2

Author(s):

D. Lam ◽

S.Y. Khim

An inexpensive method of detecting localised parametric defects in static RAM

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263143 ◽

2002 ◽

Cited By ~ 1

Author(s):

Y. Savaria ◽

C. Thibeault

Keyword(s):

Inexpensive Method ◽

Static Ram

Functional testing of RAMs by random testing simulation

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263151 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Ashtijou ◽

Fusheng Chen

Keyword(s):

Random Testing ◽

Functional Testing

Algorithms to test PSF and coupling faults in random access memories

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263150 ◽

2002 ◽

Cited By ~ 1

Author(s):

R. Rajsuman

Keyword(s):

Random Access ◽

Coupling Faults

Records of the 1993 IEEE International Workshop on Memory TestingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc. Press

A 20 MHz test vector generator for producing tests that detect single 4- and 5-coupling faults in RAMs

Key attributes of an SRAM testing strategy required for effective process monitoring

A high-speed boundary search Shmoo plot for ULSI memories

Fault location algorithms for repairable embedded RAMs

Modeling of faulty behavior of ECL storage elements

Are NV-memories non-volatile?

Effective tests for memories based on faults models for low PPM defects

An inexpensive method of detecting localised parametric defects in static RAM

Functional testing of RAMs by random testing simulation

Algorithms to test PSF and coupling faults in random access memories

Records of the 1993 IEEE International Workshop on Memory Testing
Latest Publications