2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)
Latest Publications

TOTAL DOCUMENTS

171

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781479966325

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Supply voltage dependence of single event upset sensitivity in diverse SRAM devices

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107149 ◽

2014 ◽

Cited By ~ 3

Author(s):

Zhangang Zhang ◽

Jie Liu ◽

Youmei Sun ◽

Mingdong Hou ◽

Teng Tong ◽

...

Keyword(s):

Voltage Dependence ◽

Supply Voltage ◽

Single Event Upset ◽

Single Event

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System design for integration of cost, reliability and performance using analytical target

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107345 ◽

2014 ◽

Author(s):

Mengqi Li ◽

Minghong Han

Keyword(s):

System Design ◽

And Performance

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Hot carrier effects of H-shaped SOI-NMOS

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107151 ◽

2014 ◽

Author(s):

Binhong Li ◽

Jiantou Gao ◽

Kai Zhao ◽

Xing Zhao ◽

Fang Yu ◽

...

Keyword(s):

Hot Carrier ◽

Hot Carrier Effects

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Remaining useful life estimation based on gamma process considered with measurement error

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107275 ◽

2014 ◽

Cited By ~ 2

Author(s):

Qidong Wei ◽

Dan Xu

Keyword(s):

Measurement Error ◽

Remaining Useful Life ◽

Gamma Process ◽

Life Estimation ◽

Useful Life

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Reliability simulation of surface crack growth and analysis of life cycles

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107332 ◽

2014 ◽

Author(s):

Dangxiang Yi ◽

Chunhe Liu ◽

Shaoping Zhao ◽

Shinian Zhang ◽

Guobin Zhang

Keyword(s):

Crack Growth ◽

Surface Crack ◽

Life Cycles ◽

Surface Crack Growth

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Risk-informed periodic surveillance testing interval of digital safety systems with self-diagnosis capacity

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107385 ◽

2014 ◽

Author(s):

Jianming Shi ◽

Gong Wang

Keyword(s):

Testing Interval ◽

Safety Systems

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A genetic algorithm based configuration optimization method for AFDX

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107235 ◽

2014 ◽

Cited By ~ 3

Author(s):

Xinkun Li ◽

Ning Huang ◽

Fei Zhao

Keyword(s):

Genetic Algorithm ◽

Optimization Method ◽

Configuration Optimization

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Requires analysis based on software maintainability

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107202 ◽

2014 ◽

Author(s):

Wensheng Hu ◽

Shiyi Wu ◽

Ming Zhao ◽

Jianfeng Yang

Keyword(s):

Software Maintainability

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Life estimation of analog IC based on accelerated degradation testing

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107314 ◽

2014 ◽

Cited By ~ 1

Author(s):

Jun Luo ◽

Guolin Qin ◽

Kaizhou Tan ◽

Shenglei Zhao ◽

Haoran Chen ◽

...

Keyword(s):

Life Estimation ◽

Analog Ic ◽

Accelerated Degradation ◽

Accelerated Degradation Testing ◽

Degradation Testing

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Research on the influence of contact gap on AC arc duration of electromagnetic relay

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) ◽

10.1109/icrms.2014.7107190 ◽

2014 ◽

Cited By ~ 1

Author(s):

Xuerong Ye ◽

Han Zhao ◽

Huimin Liang ◽

Guofu Zhai

Keyword(s):

Electromagnetic Relay ◽

Ac Arc

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2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Supply voltage dependence of single event upset sensitivity in diverse SRAM devices

System design for integration of cost, reliability and performance using analytical target

Hot carrier effects of H-shaped SOI-NMOS

Remaining useful life estimation based on gamma process considered with measurement error

Reliability simulation of surface crack growth and analysis of life cycles

Risk-informed periodic surveillance testing interval of digital safety systems with self-diagnosis capacity

A genetic algorithm based configuration optimization method for AFDX

Requires analysis based on software maintainability

Life estimation of analog IC based on accelerated degradation testing

Research on the influence of contact gap on AC arc duration of electromagnetic relay

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)
Latest Publications