2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR)
Latest Publications

TOTAL DOCUMENTS

15

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By IEEE

9781509018802

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Critical review of U.S. Military environmental stress screening (ESS) handbook

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762267 ◽

2016 ◽

Author(s):

Nga Man Li ◽

Diganta Das

Keyword(s):

Environmental Stress ◽

Critical Review

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Reliability of conformal coated surface mount packages

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762293 ◽

2016 ◽

Author(s):

Deng Yun Chen ◽

Michael Osterman

Keyword(s):

Surface Mount ◽

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Tools for analysis of accelerated life and degradation test data

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762296 ◽

2016 ◽

Author(s):

Reuel Smith ◽

Mohammad Modarres

Keyword(s):

Test Data ◽

Accelerated Life ◽

Degradation Test

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Planning of reliability life tests within the accuracy, time and cost triangle

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762270 ◽

2016 ◽

Author(s):

Martin Dazer ◽

Matthias Stohrer ◽

Stefan Kemmler ◽

Bernd Bertsche

Keyword(s):

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Accelerated stress & reliability testing for software and cyber-physical systems

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762263 ◽

2016 ◽

Author(s):

Jeremy Straub

Keyword(s):

Cyber Physical Systems ◽

Reliability Testing ◽

Physical Systems

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Reliability of corner staked surface mount packages

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762272 ◽

2016 ◽

Author(s):

Deng Yun Chen ◽

Michael Osterman

Keyword(s):

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Accelerated life testing of a commercial door handle

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762262 ◽

2016 ◽

Author(s):

Michael Stasiak ◽

Brian Hyde

Keyword(s):

Accelerated Life Testing ◽

Life Testing ◽

Accelerated Life

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Sustaining quality of services through service reliability and availability

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762294 ◽

2016 ◽

Author(s):

Karthikh Pandian ◽

Chinnathurai

Keyword(s):

Quality Of Services ◽

Service Reliability ◽

Reliability And Availability

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An accelerated on-wafer test to improve long-term reliability of a 0.25 μm PHEMT process

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762264 ◽

2016 ◽

Author(s):

Wayne Struble ◽

Nishant Yamujala ◽

Jason Barrett

Keyword(s):

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Thin MLCC (multi-layer ceramic capacitor) reliability evaluation using an accelerated ramp voltage test

2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) ◽

10.1109/astr.2016.7762295 ◽

2016 ◽

Author(s):

John Scarpulla ◽

Talin Ayvazian ◽

Walter Buell ◽

Megan Campbell ◽

Andrei Dubitsky ◽

...

Keyword(s):

Reliability Evaluation ◽

Ceramic Capacitor ◽

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