Springer Series in Surface Sciences - The Structure of Surfaces II
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Published By Springer Berlin Heidelberg

9783642733451, 9783642733437

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Ordered Dimer Structures and Defects on Si(001) Studied by High Resolution Helium Atom Scattering

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_94 ◽

1988 ◽

pp. 575-580 ◽

Author(s):

D. M. Rohlfing ◽

J. Ellis ◽

B. J. Hinch ◽

W. Allison ◽

R. F. Willis

Keyword(s):

High Resolution ◽

Helium Atom ◽

Helium Atom Scattering ◽

Atom Scattering

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The Step Roughening of the Cu(113) Surface: A Grazing Incidence X-Ray Scattering Study

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_83 ◽

1988 ◽

pp. 509-513

Author(s):

K. S. Liang ◽

E. B. Sirota ◽

K. L. D’Amico ◽

G. J. Hughes ◽

S. K. Sinha ◽

...

Keyword(s):

Grazing Incidence ◽

X Ray ◽

X Ray Scattering ◽

Scattering Study ◽

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High Resolution He-Scattering Studies of Physisorbed Films

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_82 ◽

1988 ◽

pp. 502-508

Author(s):

K. Kern ◽

R. David ◽

P. Zeppenfeld ◽

G. Comsa

Keyword(s):

High Resolution

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Temperature-Dependent Dynamics of a Displacively Reconstructed Surface: W(001)

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_75 ◽

1988 ◽

pp. 458-462

Author(s):

C. Z. Wang ◽

A. Fasolino ◽

E. Tosatti

Keyword(s):

Temperature Dependent ◽

Reconstructed Surface

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Interface Pseudomorphism Detected by Mössbauer Spectroscopy

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_70 ◽

1988 ◽

pp. 426-430 ◽

Author(s):

M. Przybylski ◽

U. Gradmann

Keyword(s):

Mössbauer Spectroscopy ◽

Mossbauer Spectroscopy ◽

Mößbauer Spectroscopy

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The Theory of SEELFS from Adsorbates

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_7 ◽

1988 ◽

pp. 32-37

Author(s):

D. K. Saldin

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Chemisorption Geometry of Molybdenum on Silicon Surfaces

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_59 ◽

1988 ◽

pp. 357-362

Author(s):

Tang Shaoping ◽

Zhang Kaiming ◽

Xie Xide

Keyword(s):

Silicon Surfaces

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High Sensitivity Detection of a Few Atomic Layers of Adsorbate by RHEED-TRAXS (Total Reflection Angle X-Ray Spectroscopy)

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_55 ◽

1988 ◽

pp. 334-339 ◽

Author(s):

S. Ino ◽

S. Hasegawa ◽

H. Matsumoto ◽

H. Daimon

Keyword(s):

High Sensitivity ◽

Total Reflection ◽

X Ray ◽

Reflection Angle ◽

High Sensitivity Detection ◽

Sensitivity Detection

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Screened Coulomb Interaction at Semiconductor Surfaces: The Contribution of Surface States

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_51 ◽

1988 ◽

pp. 309-315

Author(s):

R. Del Sole ◽

L. Reining

Keyword(s):

Coulomb Interaction ◽

Surface States ◽

Semiconductor Surfaces

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Comparison of the Quasidynamical and Tensor LEED Approximation for LEED Intensity Spectra from a Reconstructed Surface

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_5 ◽

1988 ◽

pp. 19-25

Author(s):

N. Bickel ◽

K. Heinz ◽

H. Landskron ◽

P. J. Rous ◽

J. B. Pendry ◽

...

Keyword(s):

Reconstructed Surface

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