Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
Latest Publications

TOTAL DOCUMENTS

157

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE Comput. Soc

0769509932

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Design challenges and emerging EDA solutions in mixed-signal IC design

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915100 ◽

2005 ◽

Cited By ~ 1

Author(s):

G. Gielen

Keyword(s):

Ic Design ◽

Mixed Signal ◽

Design Challenges ◽

Mixed Signal Ic

Download Full-text

Managing the SoC design challenge with 'soft' hardware

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915086 ◽

2005 ◽

Cited By ~ 1

Author(s):

R. Wilson

Keyword(s):

Design Challenge

Download Full-text

The programmable platform: does one size fit all?

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915507 ◽

2005 ◽

Author(s):

A. Lock ◽

R. Camposano ◽

A. Cuomo ◽

R. Subramanian ◽

H. Meyr

Download Full-text

C/C ++: progress or deadlock in system-level specification

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915013 ◽

2005 ◽

Author(s):

E. Villar ◽

D. Gajski ◽

W. Rosenstiel ◽

J. Plantin ◽

P. Cavalloro ◽

...

Keyword(s):

System Level

Download Full-text

Data management - limiter or accelerator for electronic design creativity

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915018 ◽

2005 ◽

Author(s):

H.-U. Heidbrink

Keyword(s):

Data Management ◽

Design Creativity ◽

Electronic Design

Download Full-text

Simulation method to extract characteristics for digital wireless communication systems

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915021 ◽

2002 ◽

Author(s):

L. Nguyen ◽

V. Janicot

Keyword(s):

Wireless Communication ◽

Communication Systems ◽

Simulation Method ◽

Wireless Communication Systems

Download Full-text

Towards a better understanding of failure modes and test requirements of ADCs

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915129 ◽

2002 ◽

Cited By ~ 1

Author(s):

A. Lechner ◽

A. Richardson ◽

B. Hermes

Keyword(s):

Failure Modes ◽

Test Requirements

Download Full-text

Power aware microarchitecture resource scaling

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915023 ◽

2002 ◽

Cited By ~ 28

Author(s):

A. Iyer ◽

D. Marculescu

Download Full-text

Testing TAPed cores and wrapped cores with the same test access mechanism

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915016 ◽

2002 ◽

Cited By ~ 5

Author(s):

M. Benabdenbi ◽

W. Maroufi ◽

M. Marzouki

Keyword(s):

Test Access Mechanism

Download Full-text

Modeling electromagnetic emission of integrated circuits for system analysis

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915046 ◽

2002 ◽

Cited By ~ 5

Author(s):

P. Kralicek ◽

W. John ◽

H. Garbe

Keyword(s):

Integrated Circuits ◽

System Analysis ◽

Electromagnetic Emission

Download Full-text

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc

Design challenges and emerging EDA solutions in mixed-signal IC design

Managing the SoC design challenge with 'soft' hardware

The programmable platform: does one size fit all?

C/C ++: progress or deadlock in system-level specification

Data management - limiter or accelerator for electronic design creativity

Simulation method to extract characteristics for digital wireless communication systems

Towards a better understanding of failure modes and test requirements of ADCs

Power aware microarchitecture resource scaling

Testing TAPed cores and wrapped cores with the same test access mechanism

Modeling electromagnetic emission of integrated circuits for system analysis

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
Latest Publications