2012 IEEE 18th International On-Line Testing Symposium (IOLTS)
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781467320856, 9781467320825, 9781467320849

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

RIIF - Reliability information interchange format

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313849 ◽

2012 ◽

Cited By ~ 6

Author(s):

Adrian Evans ◽

Michael Nicolaidis ◽

Shi-Jie Wen ◽

Dan Alexandrescu ◽

Enrico Costenaro

Keyword(s):

Interchange Format ◽

Information Interchange

Towards optimized functional evaluation of SEE-induced failures in complex designs

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313869 ◽

2012 ◽

Cited By ~ 7

Author(s):

Dan Alexandrescu ◽

Enrico Costenaro

Keyword(s):

Functional Evaluation

Functional level embedded self testing for Walsh transform based adaptive hardware

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313857 ◽

2012 ◽

Cited By ~ 1

Author(s):

Ariel Burg ◽

Osnat Keren

Keyword(s):

Walsh Transform ◽

Functional Level ◽

Self Testing

Front matter

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313831 ◽

2012 ◽

Reliable and secure memories based on algebraic manipulation correction codes

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313861 ◽

2012 ◽

Cited By ~ 11

Author(s):

Zhen Wang ◽

Mark Karpovsky

Keyword(s):

Algebraic Manipulation

Error detection and correction of single event upset (SEU) tolerant latch

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313832 ◽

2012 ◽

Cited By ~ 4

Author(s):

N Julai ◽

A Yakovlev ◽

A Bystrov

Keyword(s):

Error Detection ◽

Single Event Upset ◽

Single Event ◽

Error Detection And Correction

Event-driven on-line co-simulation with fault diagnostic

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313854 ◽

2012 ◽

Author(s):

Mikhail Baklashov

Keyword(s):

Event Driven ◽

On Line ◽

Fault Diagnostic

Logic masking for SET Mitigation Using Approximate Logic Circuits

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313868 ◽

2012 ◽

Cited By ~ 16

Author(s):

A. Sanchez-Clemente ◽

L. Entrena ◽

M. Garcia-Valderas ◽

C. Lopez-Ongil

Keyword(s):

Logic Circuits

Neutron radiation test of graphic processing units

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313841 ◽

2012 ◽

Cited By ~ 16

Author(s):

P. Rech ◽

C. Aguiar ◽

R. Ferreira ◽

C. Frost ◽

L. Carro

Keyword(s):

Neutron Radiation ◽

Graphic Processing Units ◽

Radiation Test ◽

Graphic Processing

Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors

2012 IEEE 18th International On-Line Testing Symposium (IOLTS) ◽

10.1109/iolts.2012.6313864 ◽

2012 ◽

Cited By ~ 2

Author(s):

Ameya Chaudhari ◽

Jacob Abraham

Keyword(s):

Intrusion Detection ◽

Stream Cipher ◽

Embedded Processors ◽

Execution Monitoring

2012 IEEE 18th International On-Line Testing Symposium (IOLTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

RIIF - Reliability information interchange format

Towards optimized functional evaluation of SEE-induced failures in complex designs

Functional level embedded self testing for Walsh transform based adaptive hardware

Front matter

Reliable and secure memories based on algebraic manipulation correction codes

Error detection and correction of single event upset (SEU) tolerant latch

Event-driven on-line co-simulation with fault diagnostic

Logic masking for SET Mitigation Using Approximate Logic Circuits

Neutron radiation test of graphic processing units

Stream cipher hash based execution monitoring (SCHEM) framework for intrusion detection on embedded processors

2012 IEEE 18th International On-Line Testing Symposium (IOLTS)
Latest Publications