Nanoscale Standards by Metrological AFM and Other Instruments
Latest Publications

TOTAL DOCUMENTS

8

(FIVE YEARS 8)

H-INDEX

0

(FIVE YEARS 0)

Published By IOP Publishing

9780750331913

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Nano particle size

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch6 ◽

2021 ◽

Author(s):

Ichiko Misumi

Keyword(s):

Particle Size ◽

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Step height

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch3 ◽

2021 ◽

Author(s):

Ichiko Misumi

Keyword(s):

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Nano dimensional standards

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch1 ◽

2021 ◽

Author(s):

Ichiko Misumi

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One-dimensional grating

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch2 ◽

2021 ◽

Author(s):

Ichiko Misumi

Keyword(s):

One Dimensional

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Line width

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch5 ◽

2021 ◽

Author(s):

Ichiko Misumi

Keyword(s):

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Surface roughness

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch7 ◽

2021 ◽

Author(s):

Ichiko Misumi

Keyword(s):

Surface Roughness

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Secondary realization of the SI meter using silicon lattice parameters

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch8 ◽

2021 ◽

Author(s):

Ichiko Misumi

Keyword(s):

Lattice Parameters ◽

Silicon Lattice

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Two-dimensional grating

Nanoscale Standards by Metrological AFM and Other Instruments ◽

10.1088/978-0-7503-3191-3ch4 ◽

2021 ◽

Author(s):

Ichiko Misumi

Keyword(s):

Two Dimensional

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