2009 IEEE International Conference on Microelectronic Test Structures
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9781424442591
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An Analysis of Temperature Impact on MOSFET Mismatch

2009 ◽  
Author(s):  
S. Mennillo ◽  
A. Spessot ◽  
L. Vendrame ◽  
L. Bortesi
Keyword(s):  
Temperature Impact

Electrical Test Structures for Investigating the Effects of Optical Proximity Correction

2009 ◽  
Author(s):  
A. Tsiamis ◽  
S. Smith ◽  
M. McCallum ◽  
A.C. Hourd ◽  
J.T.M. Stevenson ◽  
...  
Keyword(s):  
Electrical Test ◽  
Optical Proximity Correction

Array Test Structure for Ultra-Thin Gate Oxide Degradation Issues

2009 ◽  
Author(s):  
Kristian M. Hafkemeyer ◽  
Andreas Domdey ◽  
Dietmar Schroeder ◽  
Wolfgang H. Krautschneider
Keyword(s):  
Gate Oxide ◽  
Test Structure ◽  
Oxide Degradation ◽  
Thin Gate Oxide

Estimating MOSFET Leakage from Low-cost, Low-resolution Fast Parametric Test

2009 ◽  
Author(s):  
Sharad Saxena ◽  
Takumi Uezono ◽  
Rakesh Vallishayee ◽  
Ron Lindley ◽  
Andrew Swimmer ◽  
...  
Keyword(s):  
Low Cost ◽  
Low Resolution ◽  
Parametric Test
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