2012 IEEE International Conference on IC Design & Technology
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53
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Published By IEEE

9781467301459, 9781467301466, 9781467301442
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing

2012 ◽  
Author(s):  
Dimitri Soussan ◽  
Alexandre Valentian ◽  
Sylvain Majcherczak ◽  
Marc Belleville
Keyword(s):  
Calibration Technique ◽  
Fully Depleted

Optimization problems for plasma-induced damage - A concept for plasma-induced damage design

2012 ◽  
Author(s):  
Koji Eriguchi ◽  
Yoshinori Nakakubo ◽  
Asahiko Matsuda ◽  
Masayuki Kamei ◽  
Yoshinori Takao ◽  
...  
Keyword(s):  
Optimization Problems

A new statistical setup and hold time definition

2012 ◽  
Author(s):  
Xiaoliang Bai ◽  
Prayag Patel ◽  
Xiaonan Zhang
Keyword(s):  
Hold Time

Reliability driven guideline for BEOL Optimization: Protecting MOS stacks from hydrogen-related impurity penetration

2012 ◽  
Author(s):  
Ziyuan Liu ◽  
Fumihiko Hayashi ◽  
Shinji Fujieda ◽  
Markus Wilde ◽  
Katsuyuki Fukutani
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