X-Ray Methods for the Characterization of Nanoparticles

2005 ◽  
pp. 163-196
Author(s):  
Hartwig Modrow
Keyword(s):  
X Ray ◽  
Ray Methods

Darstellung und Charakterisierung von 1.4- und 1.5-Dienkomplexen des Platins- Röntgenstrukturanalyse von Dichloro-2.5-diphenyl-1.5-hexadienplatin(II), Cl2Pt((C6H5)2C6H8) / Preparation and Characterization of 1,4- and 1,5-Diene Complexes of Platinum; X-ray Analysis of Dichloro-2,5-diphenyl-1,5-hexadiene Platinum(II), ((Cl2Pt(C6H5)2C6H8)

1980 ◽  
Vol 35 (7) ◽  
pp. 802-807 ◽  
Author(s):  
Michael Kopp ◽  
Luise R. Krauth ◽  
Richard Ratka ◽  
Klaus Weidenhammer ◽  
Manfred L. Ziegler
Keyword(s):  
Mass Spectroscopy ◽  
Elemental Analysis ◽  
X Ray ◽  
H Nmr ◽  
Ray Methods

The reaction of cis-(C6H5CN)2PtCl2 and Na2PtCl4 with the dienes 1,4-pentadiene and 2,5-diphenyl-1,5-hexadiene yields the species cis-(1,4-pentadiene) PtCl2 and cis-(2,5-diphenyl-1,5-hexadiene)PtCl2, respectively. The compounds have been fully characterized by elemental analysis, IR, 1H-NMR, mass spectroscopy and by X-ray methods

Characterization of ZnO structures by optical and X-ray methods

2013 ◽  
Vol 281 ◽  
pp. 123-128 ◽  
Author(s):  
P. Petrik ◽  
B. Pollakowski ◽  
S. Zakel ◽  
T. Gumprecht ◽  
B. Beckhoff ◽  
...  
Keyword(s):  
X Ray ◽  
Ray Methods

Characterization of single-crystal sapphire substrates by X-ray methods and atomic force microscopy

2011 ◽  
Vol 56 (3) ◽  
pp. 456-462 ◽  
Author(s):  
I. A. Prokhorov ◽  
B. G. Zakharov ◽  
V. E. Asadchikov ◽  
A. V. Butashin ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
X Ray ◽  
Force Microscopy ◽  
Sapphire Substrates ◽  
Atomic Force ◽  
Single Crystal Sapphire ◽  
Ray Methods
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