Characterization of single-crystal sapphire substrates by X-ray methods and atomic force microscopy

2011 ◽  
Vol 56 (3) ◽  
pp. 456-462 ◽  
Author(s):  
I. A. Prokhorov ◽  
B. G. Zakharov ◽  
V. E. Asadchikov ◽  
A. V. Butashin ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
X Ray ◽  
Force Microscopy ◽  
Sapphire Substrates ◽  
Atomic Force ◽  
Single Crystal Sapphire ◽  
Ray Methods

Structural characterization of dimercury(1+) pentacyanonitrosylferrate(2−), Hg2[Fe(CN)5NO]

2000 ◽  
Vol 15 (3) ◽  
pp. 193-197
Author(s):  
V. Venegas ◽  
G. Rueda-Morales ◽  
E. Reguera ◽  
F. Caleyo
Keyword(s):  
Atomic Force Microscopy ◽  
Orthorhombic Symmetry ◽  
Unit Cell Parameters ◽  
Calculated Density ◽  
X Ray ◽  
Cell Parameters ◽  
Force Microscopy ◽  
Atomic Force ◽  
Density Values

The titled compound, Hg2[Fe(CN)5NO], was synthesized and studied by X-ray powder diffraction, infrared spectroscopy, Mössbauer spectroscopy, and atomic force microscopy. The results arising from this study indicate that this compound is anhydrous and crystallizes in the P222 orthorhombic symmetry. The unit cell parameters were quantified as a=16.5905(9) Å, b=12.3145(8) Å, and c=8.7576(5) Å. The measured and calculated density values are Dm=1.149 g/cm3 and Dc=1.145 g/cm3, respectively, with Z=2.

Application of different atomic force microscopy methods for detailed diagnostics of gold nanocoatings on a single-crystal sapphire surface

2011 ◽  
Vol 56 (3) ◽  
pp. 508-516 ◽  
Author(s):  
A. E. Muslimov ◽  
Yu. O. Volkov ◽  
V. E. Asadchikov ◽  
V. M. Kanevskii ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Sapphire Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Single Crystal Sapphire

Characterization of kaolinite in the hardsetting clay fraction using atomic force microscopy, X-ray diffraction, and the Rietveld method

2017 ◽  
Vol 17 (8) ◽  
pp. 2144-2155 ◽  
Author(s):  
Luis Valério Prandel ◽  
Nívea Maria Piccolomini Dias ◽  
Sérgio da Costa Saab ◽  
André Maurício Brinatti ◽  
Neyde Fabíola Balarezo Giarola ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Rietveld Method ◽  
Clay Fraction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes

2021 ◽  
Vol 92 (11) ◽  
pp. 113701
Author(s):  
Shawn L. Riechers ◽  
Nikolai Petrik ◽  
John S. Loring ◽  
Mark K. Murphy ◽  
Carolyn I. Pearce ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Characterization ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Radiation Induced

Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

2013 ◽  
Vol 210 (11) ◽  
pp. 2416-2422 ◽  
Author(s):  
Daniele Pelliccia ◽  
Sasikaran Kandasamy ◽  
Michael James
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica

2007 ◽  
Vol 601 (13) ◽  
pp. 2735-2739 ◽  
Author(s):  
Renato Buzio ◽  
Andrea Toma ◽  
Andrea Chincarini ◽  
Francesco Buatier de Mongeot ◽  
Corrado Boragno ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Photoelectron Spectroscopy ◽  
Low Energy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

2006 ◽  
Vol 252 (9) ◽  
pp. 3342-3351 ◽  
Author(s):  
G. Brauer ◽  
W. Anwand ◽  
F. Eichhorn ◽  
W. Skorupa ◽  
C. Hofer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force
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