eAMTexplorer: a software package for texture and signal characterization using Angle Measure Technique

2008 ◽  
Vol 22 (11-12) ◽  
pp. 717-721 ◽  
Author(s):  
Knut Kvaal ◽  
Sergei V. Kucheryavski ◽  
Maths Halstensen ◽  
Simen Kvaal ◽  
Andreas S. Flø ◽  
...  
Keyword(s):  
Software Package ◽  
Angle Measure ◽  
Angle Measure Technique ◽  
Signal Characterization ◽  
Measure Technique

The AMT Features Extraction from Batch Drilling Step Monitor Signals and its Applications

2013 ◽  
Vol 718-720 ◽  
pp. 517-520
Author(s):  
You Hang Zhou ◽  
Qiao Zhang
Keyword(s):  
Principal Component Analysis ◽  
High Precision ◽  
Principal Component ◽  
Normalization Method ◽  
Drilling Process ◽  
Angle Measure ◽  
Angle Measure Technique ◽  
Spindle Power ◽  
Measure Technique

Angle Measure Technique (AMT) algorithm is proposed to analyze the quality of batch drilling process in this paper. The groups spindle power (SP) signals of batch drilling were preprocessed by the normalization method, and then the AMT was used to extract the scale features of monitor signals from local to global. By the method of Principal Component Analysis (PCA), the dimensionality of these scale features was reduced to obtain a distribution of the step quality of batch drilling. The results indicate that this method can be used for observation of high precision cutting step quality.

Optimal corrections for digitization and quantification effects in angle measure technique (AMT) texture analysis

2008 ◽  
Vol 22 (11-12) ◽  
pp. 722-737 ◽  
Author(s):  
Sergei V. Kucheryavski ◽  
Knut Kvaal ◽  
Maths Halstensen ◽  
Peter Paasch Mortensen ◽  
Casper K. Dahl ◽  
...  
Keyword(s):  
Texture Analysis ◽  
Angle Measure ◽  
Angle Measure Technique ◽  
Measure Technique

The angle measure technique: A new method for characterizing the complexity of geomorphic lines

1994 ◽  
Vol 26 (1) ◽  
pp. 83-97 ◽  
Author(s):  
Robert Andrle
Keyword(s):  
New Method ◽  
Angle Measure ◽  
Angle Measure Technique ◽  
Measure Technique

Applications of Angle Measure Technique (AMT) in image analysis

2000 ◽  
Vol 54 (1) ◽  
pp. 1-19 ◽  
Author(s):  
Jun Huang ◽  
Kim H Esbensen
Keyword(s):  
Image Analysis ◽  
Angle Measure ◽  
Angle Measure Technique ◽  
Measure Technique

Classification and analysis of non-isotropic images by Angle Measure Technique (AMT) with contour unfolding

2009 ◽  
Vol 642 (1-2) ◽  
pp. 135-141 ◽  
Author(s):  
Sergey Kucheryavski ◽  
Ivan Belyaev
Keyword(s):  
Angle Measure ◽  
Angle Measure Technique ◽  
Measure Technique

Optimization of the Angle Measure Technique for image analytical sampling of particulate matter

2005 ◽  
Vol 75 (2) ◽  
pp. 219-229 ◽  
Author(s):  
Peter P. Mortensen ◽  
Kim H. Esbensen
Keyword(s):  
Particulate Matter ◽  
Angle Measure ◽  
Angle Measure Technique ◽  
Measure Technique

Applications of AMT (Angle Measure Technique) in image analysis

2001 ◽  
Vol 57 (1) ◽  
pp. 37-56 ◽  
Author(s):  
Jun Huang ◽  
Kim H Esbensen
Keyword(s):  
Image Analysis ◽  
Angle Measure ◽  
Angle Measure Technique ◽  
Measure Technique

scholarly journals Application of the angle measure technique as image texture analysis method for the identification of uranium ore concentrate samples: New perspective in nuclear forensics

Talanta ◽  
2016 ◽  
Vol 152 ◽  
pp. 463-474 ◽  
Author(s):  
Lorenzo Fongaro ◽  
Doris Mer Lin Ho ◽  
Knut Kvaal ◽  
Klaus Mayer ◽  
Vincenzo V. Rondinella
Keyword(s):  
Texture Analysis ◽  
Nuclear Forensics ◽  
Image Texture ◽  
Analysis Method ◽  
Image Texture Analysis ◽  
Uranium Ore ◽  
Uranium Ore Concentrate ◽  
New Perspective ◽  
Angle Measure Technique ◽  
Measure Technique

Quanitative aspects of electron diffraction using electron holography

1995 ◽  
Vol 53 ◽  
pp. 616-617
Author(s):  
E. Völkl ◽  
L.F. Allard ◽  
B. Frost ◽  
T.A. Nolan
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Software Package ◽  
Spatial Coherence ◽  
Electron Holography ◽  
Image Intensity ◽  
Interference Fringes ◽  
Complex Image ◽  
The Difference ◽  
Recorded Image

Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron beam, and Φk is the resulting vector of the difference of the wavefront vectors of the two overlaping beams. Using a software package like HoloWorks, the complex image wave Ψ can be extracted.

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