ChemInform Abstract: ELECTRONIC STRUCTURE OF THE OXIDES OF LEAD PART 1, A STUDY USING X-RAY AND ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY OF THE OXIDATION OF POLYCRYSTALLINE LEAD PART 2, AN XPS STUDY OF BULK RHOMBIC PBO, TETRAGONAL PBO, BETA-PBO2 AND PB3O4

1975 ◽  
Vol 6 (11) ◽  
pp. no-no
Author(s):  
STEPHEN EVANS ◽  
JOHN M. THOMAS ◽  
MICHAEL J. TRICKER
Keyword(s):  
Electronic Structure ◽  
Photoelectron Spectroscopy ◽  
Ultraviolet Photoelectron Spectroscopy ◽  
X Ray ◽  
Xps Study

Surface Band Structure Studies of Si Rich Reconstructions on 4H-SiC(1-100)

2005 ◽  
Vol 483-485 ◽  
pp. 547-550 ◽  
Author(s):  
Konstantin V. Emtsev ◽  
Thomas Seyller ◽  
Lothar Ley ◽  
A. Tadich ◽  
L. Broekman ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Electron Diffraction ◽  
Photoelectron Spectroscopy ◽  
Low Energy ◽  
Ultraviolet Photoelectron Spectroscopy ◽  
Surface Band ◽  
X Ray ◽  
Low Energy Electron Diffraction ◽  
Different Temperatures ◽  
Low Energy Electron

We have investigated Si-rich reconstructions of 4H-SiC( 00 1 1 ) surfaces by means of low-energy electron diffraction (LEED), x-ray photoelectron spectroscopy (XPS), and angleresolved ultraviolet photoelectron spectroscopy (ARUPS). The reconstructions of 4H-SiC( 00 1 1 ) were prepared by annealing the sample at different temperatures in a flux of Si. Depending on the temperature different reconstructions were observed: c(2×2) at T=800°C, c(2×4) at T=840°C. Both reconstructions show strong similarities in the electronic structure.

scholarly journals X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co2FeAl) interfaced with semiconductor (n-Si) structure

2019 ◽  
Vol 37 (1) ◽  
pp. 116-121
Author(s):  
Arvind Kumar ◽  
P.C. Srivastava
Keyword(s):  
Electronic Structure ◽  
Transport Properties ◽  
Photoelectron Spectroscopy ◽  
Heusler Alloy ◽  
Crucial Role ◽  
Chemical State ◽  
X Ray ◽  
Si Substrates ◽  
Magnetic Heterostructures ◽  
Xps Study

AbstractLayered magnetic heterostructures are very promising candidates in spintronics in which the influences of interfaces, surfaces and defects play a crucial role. X-ray photoelectron spectroscopy (XPS) study has been performed for studying in detail the chemical state and electronic structure of Co2FeAl (CFA) Heusler alloy interfaced with Si substrates. XPS survey scan spectra have clearly shown the presence of Fe, Co and Al signal along with the signal due to Si. The presence of Co, Fe and Al signal confirms the formation of CFA alloy phase. Our XPS results support our previous study [1] on CFA/Si structure in determining the magnetic and transport properties across the interface.

A study of the FeX (X=Si, Ge) system electronic structure by X-ray photoelectron spectroscopy

2000 ◽  
Vol 447 (1-3) ◽  
pp. 112-116 ◽  
Author(s):  
I.N. Shabanova ◽  
V.I. Kormilets ◽  
L.D. Zagrebin ◽  
N.S. Terebova
Keyword(s):  
Electronic Structure ◽  
Photoelectron Spectroscopy ◽  
X Ray

scholarly journals Electronic structure of β-Ta films from X-ray photoelectron spectroscopy and first-principles calculations

2019 ◽  
Vol 470 ◽  
pp. 607-612 ◽  
Author(s):  
Martin Magnuson ◽  
Grzegorz Greczynski ◽  
Fredrik Eriksson ◽  
Lars Hultman ◽  
Hans Högberg
Keyword(s):  
Electronic Structure ◽  
First Principles ◽  
Photoelectron Spectroscopy ◽  
First Principles Calculations ◽  
X Ray
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