Dislocations in silicon observed by high-voltage, high-resolution electron microscopy

1982 ◽  
Vol 17 (2) ◽  
pp. 189-195 ◽  
Author(s):  
K. Hiraga ◽  
M. Hirabayashi ◽  
M. Sato ◽  
K. Sumino
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Voltage ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron

Structure analyses of long range ordered alloys by high voltage, high resolution electron microscopy

Micron (1969) ◽  
1980 ◽  
Vol 11 (3-4) ◽  
pp. 235-240 ◽  
Author(s):  
O. Terasaki ◽  
D. Watanabe ◽  
K. Hiraga ◽  
D. Shindo ◽  
M. Hirabayashi
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Long Range ◽  
High Voltage ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron ◽  
Ordered Alloys
Sign in / Sign up

Export Citation Format

Share Document