Software for drift compensation, particle tracking and particle analysis of high-speed atomic force microscopy image series

High Speed ◽

Particle Analysis ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

Drift Compensation ◽

A high-efficiency atomic force microscopy image mode based on Kalman filtering

2016 35th Chinese Control Conference (CCC) ◽

10.1109/chicc.2016.7554811 ◽

2016 ◽

Author(s):

Yinan Wu ◽

Yongchun Fang ◽

Xiao Ren

Keyword(s):

Atomic Force Microscopy ◽

Kalman Filtering ◽

High Efficiency ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

New Method for Noncontact Atomic Force Microscopy Image Simulations

Japanese Journal of Applied Physics ◽

10.1143/jjap.38.192 ◽

1999 ◽

Vol 38 (Part 1, No. 1A) ◽

pp. 192-194 ◽

Cited By ~ 19

Author(s):

Naruo Sasaki ◽

Masaru Tsukada

Keyword(s):

Atomic Force Microscopy ◽

New Method ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

Image Simulations ◽

Fourier Expansion Method for Noncontact Atomic Force Microscopy Image Simulations -- Application to Si(111) \sqrt3×\sqrt3-Ag Surface

Japanese Journal of Applied Physics ◽

10.1143/jjap.39.l174 ◽

2000 ◽

Vol 39 (Part 2, No. 2B) ◽

pp. L174-L177 ◽

Cited By ~ 7

Author(s):

Naruo Sasaki ◽

Hideaki Aizawa ◽

Masaru Tsukada

Keyword(s):

Atomic Force Microscopy ◽

Fourier Expansion ◽

Expansion Method ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

Image Simulations ◽

Theoretical Analysis of Tip Effect on Noncontact Atomic Force Microscopy Image of Si(100) 2×1: H Surface

Japanese Journal of Applied Physics ◽

10.1143/jjap.41.306 ◽

2002 ◽

Vol 41 (Part 1, No. 1) ◽

pp. 306-308 ◽

Cited By ~ 5

Author(s):

Nariaki Miura ◽

Masaru Tsukada

Keyword(s):

Atomic Force Microscopy ◽

Theoretical Analysis ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

First-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology

Physical Review B ◽

10.1103/physrevb.63.245323 ◽

2001 ◽

Vol 63 (24) ◽

Cited By ~ 35

Author(s):

S. H. Ke ◽

T. Uda ◽

I. Štich ◽

K. Terakura

Keyword(s):

Atomic Force Microscopy ◽

First Principles ◽

Surface Effect ◽

Image Formation ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

A generalized approach for atomic force microscopy image restoration with bregman distances as tikhonov regularization terms*

Inverse Problems in Engineering ◽

10.1080/174159700088027741 ◽

2000 ◽

Vol 8 (5) ◽

pp. 457-472 ◽

Cited By ~ 9

Author(s):

Geraldo A. G. Cidade ◽

Celia Anteneodo ◽

Nilson C. Roberty ◽

Antônio J. Silva Neto

Keyword(s):

Atomic Force Microscopy ◽

Image Restoration ◽

Tikhonov Regularization ◽

Bregman Distances ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

Understanding the atomic force microscopy image of the V2O5 and Li0.03V2O5(001) surface using ab initio calculations

Catalysis Today ◽

10.1016/j.cattod.2005.11.083 ◽

2006 ◽

Vol 113 (3-4) ◽

pp. 263-269

Author(s):

A.D. Sayede ◽

C. Mathieu ◽

B. Khelifa

Keyword(s):

Atomic Force Microscopy ◽

Ab Initio Calculations ◽

Ab Initio ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

SURFACE PROPERTIES OF ITO THIN FILMS USING ATOMIC FORCE MICROSCOPY IMAGE PROCESSING

EPMESC VII ◽

10.1016/b978-0-08-043570-1.50024-3 ◽

1999 ◽

pp. 199-207

Author(s):

A. Amaral ◽

P. Brogueira ◽

C. Nunes de Carvalho ◽

G. Lavareda

Keyword(s):

Thin Films ◽

Image Processing ◽

Atomic Force Microscopy ◽

Surface Properties ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

Ito Thin Films ◽

Restoration Method of Atomic Force Microscopy Image Based on Transfer Learning

ACTA PHOTONICA SINICA ◽

10.3788/gzxb20204904.0410006 ◽

2020 ◽

Vol 49 (4) ◽

pp. 410006-410006

Author(s):

胡佳成 Jia-cheng HU ◽

颜迪新 Di-xin YAN ◽

施玉书 Yu-shu SHI ◽

黄鹭 Lu HUANG ◽

李东升 Dong-sheng LI

Keyword(s):

Atomic Force Microscopy ◽

Transfer Learning ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽

Restoration Method ◽

Segmenting overlapping nano-objects in atomic force microscopy image

Journal of Nanophotonics ◽

10.1117/1.jnp.12.016003 ◽

2018 ◽

Vol 12 (01) ◽

pp. 1 ◽

Cited By ~ 1

Author(s):

Qian Wang ◽

Yuexing Han ◽

Qing Li ◽

Bing Wang ◽

Akihiko Konagaya

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Image ◽