Tools and techniques for solution‐phase structural understanding of SmI 2 –additive complexes

2022 ◽  
Author(s):  
Sandeepan Maity
Keyword(s):  
Solution Phase ◽  
Tools And Techniques

Transition alpha structure in beta-isomorphous Nb-Hf alloys

1987 ◽  
Vol 45 ◽  
pp. 232-233
Author(s):  
R.W. Carpenter ◽  
Changhai Li ◽  
David J. Smith
Keyword(s):  
Solid Solution ◽  
Solution Phase ◽  
Miscibility Gap ◽  
Large Strains ◽  
Solid Solution Phase ◽  
Two Phase ◽  
Diffuse Intensity ◽  
Metastable Form ◽  
The Matrix ◽  
Equilibrium Morphology

Binary Nb-Hf alloys exhibit a wide bcc solid solution phase field at temperatures above the Hfα→ß transition (2023K) and a two phase bcc+hcp field at lower temperatures. The β solvus exhibits a small slope above about 1500K, suggesting the possible existence of a miscibility gap. An earlier investigation showed that two morphological forms of precipitate occur during the bcc→hcp transformation. The equilibrium morphology is rod-type with axes along <113> bcc. The crystallographic habit of the rod precipitate follows the Burgers relations: {110}||{0001}, <112> || <1010>. The earlier metastable form, transition α, occurs as thin discs with {100} habit. The {100} discs induce large strains in the matrix. Selected area diffraction examination of regions ∼2 microns in diameter containing many disc precipitates showed that, a diffuse intensity distribution whose symmetry resembled the distribution of equilibrium α Bragg spots was associated with the disc precipitate.

A Review on Big Data Analytics in Business

2018 ◽  
pp. 210-214
Author(s):  
Manbir Sandhu ◽  
Purnima, Anuradha Saini
Keyword(s):  
Big Data ◽  
Big Data Analytics ◽  
Smart Devices ◽  
Data Streaming ◽  
Huge Amount ◽  
Business Units ◽  
Enormous Amount ◽  
Tools And Techniques ◽  
Heath Care ◽  
Data Analytic

Big data is a fast-growing technology that has the scope to mine huge amount of data to be used in various analytic applications. With large amount of data streaming in from a myriad of sources: social media, online transactions and ubiquity of smart devices, Big Data is practically garnering attention across all stakeholders from academics, banking, government, heath care, manufacturing and retail. Big Data refers to an enormous amount of data generated from disparate sources along with data analytic techniques to examine this voluminous data for predictive trends and patterns, to exploit new growth opportunities, to gain insight, to make informed decisions and optimize processes. Data-driven decision making is the essence of business establishments. The explosive growth of data is steering the business units to tap the potential of Big Data to achieve fueling growth and to achieve a cutting edge over their competitors. The overwhelming generation of data brings with it, its share of concerns. This paper discusses the concept of Big Data, its characteristics, the tools and techniques deployed by organizations to harness the power of Big Data and the daunting issues that hinder the adoption of Business Intelligence in Big Data strategies in organizations.

Root Cause Analysis for Pin Leakage

2016 ◽  
Author(s):  
Zhigang Song ◽  
Jochonia Nxumalo ◽  
Manuel Villalobos ◽  
Sweta Pendyala
Keyword(s):  
Failure Analysis ◽  
Root Cause Analysis ◽  
Advanced Technology ◽  
Process Step ◽  
Cause Analysis ◽  
Hard Mask ◽  
Technology Node ◽  
Root Cause ◽  
Tools And Techniques

Abstract Pin leakage continues to be on the list of top yield detractors for microelectronics devices. It is simply manifested as elevated current with one pin or several pins during pin continuity test. Although many techniques are capable to globally localize the fault of pin leakage, root cause analysis and identification for it are still very challenging with today’s advanced failure analysis tools and techniques. It is because pin leakage can be caused by any type of defect, at any layer in the device and at any process step. This paper presents a case study to demonstrate how to combine multiple techniques to accurately identify the root cause of a pin leakage issue for a device manufactured using advanced technology node. The root cause was identified as under-etch issue during P+ implantation hard mask opening for ESD protection diode, causing P+ implantation missing, which was responsible for the nearly ohmic type pin leakage.

Topside Defect Localization Using OBIRCH Analysis

2005 ◽  
Author(s):  
Clifford Howard ◽  
Anusha Weerakoon ◽  
Diana M. Mitro ◽  
Dawn Glaeser
Keyword(s):  
Functional Analysis ◽  
Defect Location ◽  
Analysis Tools ◽  
Defect Localization ◽  
Tools And Techniques

Abstract OBIRCH analysis is a useful technique for defect localization not only for parametric failures, but also for functional analysis. However, OBIRCH results do not always identify the exact defect location. OBIRCH analysis results must be used in conjunction with other analysis tools and techniques to successfully identify defect locations.

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