Transmission electron microscopy study for investigating high-temperature reliability of Ti10
W90
-based and Ta-based diffusion barriers up to 600°C
2017 ◽
Vol 32
(24)
◽
pp. 4491-4502
◽
1989 ◽
Vol 111
◽
pp. 177-180
◽
1995 ◽
Vol 194
(1)
◽
pp. 87-98
◽