Transmission electron microscopy study of blisters in high-temperature annealed He and H co-implanted single-crystal silicon

Applied Physics Letters ◽

10.1063/1.1790031 ◽

2004 ◽

Vol 85 (10) ◽

pp. 1683-1685 ◽

Author(s):

S. Frabboni ◽

G. C. Gazzadi ◽

L. Felisari ◽

R. Tonini ◽

F. Corni ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Single Crystal ◽

Single Crystal Silicon ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Crystal Silicon ◽

Transmission Electron

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Transmission electron microscopy study of the reaction of Sn4−9 zintl ions with single crystal Au films

Ultramicroscopy ◽

10.1016/0304-3991(87)90159-8 ◽

1987 ◽

Vol 23 (2) ◽

pp. 135-149 ◽

Author(s):

M.M.J. Treacy ◽

R.C. Haushalter ◽

S.B. Rice

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Single Crystal ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

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High Resolution Transmission Electron Microscopy Study of Calcium Fluoride Single Crystal (111) Surfaces Processed by Ultraprecision Machining

MATERIALS TRANSACTIONS ◽

10.2320/matertrans.47.267 ◽

2006 ◽

Vol 47 (2) ◽

pp. 267-270 ◽

Author(s):

Naoyuki Ohnishi ◽

Shinji Yoshida ◽

Yoshiharu Namba

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Single Crystal ◽

Calcium Fluoride ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ultraprecision Machining ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Ion bombardment induced amorphous layers on single crystal stainless steel-a combined rutherford backscattering and transmission electron microscopy study

Radiation Effects ◽

10.1080/00337578008243069 ◽

1980 ◽

Vol 49 (1-3) ◽

pp. 65-69 ◽

Author(s):

W. A. Grant ◽

J. L. Whitton ◽

J. S. Williams

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Stainless Steel ◽

Single Crystal ◽

Ion Bombardment ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Rutherford Backscattering ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Analytical transmission electron microscopy study of a natural MORB sample assemblage transformed at high pressure and high temperature

American Mineralogist ◽

10.2138/am.2008.2532 ◽

2008 ◽

Vol 93 (1) ◽

pp. 144-153 ◽

Author(s):

A. Ricolleau ◽

G. Fiquet ◽

A. Addad ◽

N. Menguy ◽

C. Vanni ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Pressure ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Analytical Transmission Electron Microscopy ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of the microstructural evolution during high-temperature and low-stress (011) [11] shear creep deformation of the superalloy single crystal LEK 94

Journal of Materials Research ◽

10.1557/jmr.2017.336 ◽

2017 ◽

Vol 32 (24) ◽

pp. 4491-4502 ◽

Author(s):

Leonardo Agudo Jácome ◽

Gülcan Göbenli ◽

Gunther Eggeler

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Shear Creep ◽

Transmission Electron ◽

Superalloy Single Crystal ◽

Abstract

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Transmission Electron Microscopy Studies of Oxidation of Single Crystal Silicon Carbide at High Temperature

Materials Science Forum - PRICM 6 ◽

10.4028/0-87849-462-6.2135 ◽

2007 ◽

pp. 2135-2138

Author(s):

B. Chayasombat ◽

N. Tarumi ◽

T. Kato ◽

T. Hirayama ◽

Katsuhiro Sasaki ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Silicon Carbide ◽

High Temperature ◽

Single Crystal ◽

Single Crystal Silicon ◽

Crystal Silicon ◽

Transmission Electron

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Dislocations in CaTiO3 perovskite deformed at high-temperature: a transmission electron microscopy study

Physics and Chemistry of Minerals ◽

10.1007/bf00199499 ◽

1996 ◽

Vol 23 (6) ◽

Author(s):

P. Besson ◽

J.P. Poirier ◽

G.D. Price

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Nanoparticle Metamorphosis: An in Situ High-Temperature Transmission Electron Microscopy Study of the Structural Evolution of Heterogeneous Au:Fe2O3 Nanoparticles

ACS Nano ◽

10.1021/nn501543d ◽

2014 ◽

Vol 8 (5) ◽

pp. 5315-5322 ◽

Author(s):

William J. Baumgardner ◽

Yingchao Yu ◽

Robert Hovden ◽

Shreyas Honrao ◽

Richard G. Hennig ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Structural Evolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy and scanning transmission electron microscopy study on B-site cation ordered structures in a (1−x)Pb(Mg1/3Nb2/3)O3–xPbTiO3 single crystal

Applied Physics Letters ◽

10.1063/1.3183508 ◽

2009 ◽

Vol 95 (2) ◽

pp. 022906 ◽

Author(s):

Yukio Sato ◽

Teruyasu Mizoguchi ◽

Naoya Shibata ◽

Hiroki Moriwake ◽

Tsukasa Hirayama ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Single Crystal ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Ordered Structures ◽

Transmission Electron ◽

Scanning Transmission

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Ellipsometry and transmission electron microscopy study of MoSi2 coatings after oxidation at high temperature in air

Thin Solid Films ◽

10.1016/j.tsf.2010.07.089 ◽

2010 ◽

Vol 519 (2) ◽

pp. 605-613 ◽

Author(s):

E. Bruneton ◽

S. Martoia ◽

S. Schelz

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Temperature ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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