Negative Stiffness Produced by Rotation of Non-Spherical Particles and Its Effect on Frictional Sliding

2018 ◽  
Vol 256 (1) ◽  
pp. 1800003 ◽  
Author(s):  
Iuliia Karachevtseva ◽  
Elena Pasternak ◽  
Arcady V. Dyskin
Author(s):  
Sasa Cao ◽  
Osman E Ozbulut ◽  
Fei Shi ◽  
Jiangdong Deng

Shape memory alloy (SMA)-based seismic isolation systems can successfully reduce the peak and residual displacements of bridges during strong earthquake, but they commonly lead to an increased force demands in substructure. This study explores the development of an SMA cable-based negative stiffness isolator to alleviate this problem. The proposed isolator is composed of superelastic SMA cables and a frictional sliding bearing with convex surfaces. The frictional sliding bearing limit the forces transferred to the superstructure and provides energy dissipation, while its built-in negative stiffness mechanism reduces the force demands in substructure. SMA cables provide critical restoring forces, additional energy dissipation, and displacement-limiting capacity. Based on the force balance, the negative stiffness and restoring requirements of the SMA cable-based negative stiffness isolator were analyzed first. Then, a prototype large-scale isolator was designed and fabricated. Next, the experimental testing of the developed isolator was performed under two different vertical load levels. Finally, finite element modeling of the proposed isolator was conducted, and the simulation results and experimental results were compared and discussed. The proposed isolator generates lower forces than the SMA-based zero and positive stiffness isolators and can exhibit stable energy dissipation capabilities with very good displacement-limiting and self-centering capabilities.


Author(s):  
Daniel UGARTE

Small particles exhibit chemical and physical behaviors substantially different from bulk materials. This is due to the fact that boundary conditions can induce specific constraints on the observed properties. As an example, energy loss experiments carried out in an analytical electron microscope, constitute a powerful technique to investigate the excitation of collective surface modes (plasmons), which are modified in a limited size medium. In this work a STEM VG HB501 has been used to study the low energy loss spectrum (1-40 eV) of silicon spherical particles [1], and the spatial localization of the different modes has been analyzed through digitally acquired energy filtered images. This material and its oxides have been extensively studied and are very well characterized, because of their applications in microelectronics. These particles are thus ideal objects to test the validity of theories developed up to now.Typical EELS spectra in the low loss region are shown in fig. 2 and energy filtered images for the main spectral features in fig. 3.


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