Nitrogen‐induced changes in the electronic and structural properties of 4H‐SiC (0001)/SiO
2
interfaces
2000 ◽
Vol 15
(7)
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pp. 1612-1616
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2020 ◽
Vol 124
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pp. 114347
2010 ◽
Vol 405
(11)
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pp. 2542-2544
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2007 ◽
Vol 398
(2)
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pp. 248-251
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2011 ◽
Vol 8
(3)
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pp. 653-661
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2001 ◽
Vol 11
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pp. 2335-2339
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2011 ◽
Vol 115
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pp. 13304-13319
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