Exact computation of maximal allowable delay for general second‐order multi‐agents consensus

2021 ◽  
Author(s):  
Dan Ma ◽  
Jie Chen ◽  
Tianyou Chai
Keyword(s):  
Second Order ◽  
Exact Computation ◽  
Multi Agents

scholarly journals Network-based deployment of the second-order multi agents: a PDE approach

2020 ◽  
Vol 53 (2) ◽  
pp. 7617-7622
Author(s):  
Maria Terushkin ◽  
Emilia Fridman
Keyword(s):  
Second Order ◽  
Multi Agents

Consensus strategy for a class of multi-agents with discrete second-order dynamics

2011 ◽  
Vol 22 (4) ◽  
pp. 437-452 ◽  
Author(s):  
Jiahu Qin ◽  
Huijun Gao ◽  
Wei Xing Zheng
Keyword(s):  
Second Order ◽  
Consensus Strategy ◽  
Multi Agents

scholarly journals Consensus of second-order multi-agents with actuator saturation and asynchronous time-delays

2017 ◽  
Vol 11 (17) ◽  
pp. 3201-3210 ◽  
Author(s):  
Venkata Karteek Yanumula ◽  
Indrani Kar ◽  
Somanath Majhi
Keyword(s):  
Time Delays ◽  
Actuator Saturation ◽  
Second Order ◽  
Multi Agents

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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