Retrospective sputter depth profiling using 3D mass spectral imaging
2010 ◽
Vol 43
(1-2)
◽
pp. 41-44
◽
Leiliang Zheng
◽
Andreas Wucher
◽
Nicholas Winograd
2008 ◽
Vol 80
(23)
◽
pp. 9058-9064
◽
John S. Fletcher
◽
Sadia Rabbani
◽
Alex Henderson
◽
Paul Blenkinsopp
◽
Steve P. Thompson
◽
...
Kevin A. Douglass
◽
Demian R. Ifa
◽
Andre R. Venter
2008 ◽
Vol 80
(21)
◽
pp. 8308-8313
◽
Jacob T. Shelley
◽
Steven J. Ray
◽
Gary M. Hieftje
2011 ◽
Vol 3
(3)
◽
pp. 313-332
◽
Hui Ye
◽
Tyler Greer
◽
Lingjun Li
2015 ◽
Vol 9
(4)
◽
pp. 4260-4269
◽
Olga S. Ovchinnikova
◽
Tamin Tai
◽
Vera Bocharova
◽
Mahmut Baris Okatan
◽
Alex Belianinov
◽
...
2019 ◽
Vol 67
(50)
◽
pp. 13840-13847
◽
Jessica P. Rafson
◽
Madeleine Y. Bee
◽
Gavin L. Sacks
2008 ◽
Vol 24
(20)
◽
pp. 11803-11810
◽
Matthew J. Baker
◽
Leiliang Zheng
◽
Nicholas Winograd
◽
Nicholas P. Lockyer
◽
John C. Vickerman
2005 ◽
Vol 4
(3)
◽
pp. 52
M. Brown
◽
E. Gazi
◽
P. Gardner
◽
J. Dwyer
◽
N. Lockyer
◽
...
Fabian Ojeda
◽
Marco Signoretto
◽
Raf Van de Plas
◽
Etienne Waelkens
◽
Bart De Moor
◽
...
2009 ◽
Vol 20
(6)
◽
pp. 1068-1077
◽
Ruibing Chen
◽
Limei Hui
◽
Robert M. Sturm
◽
Lingjun Li