Editorial: Testing, Debugging, and Defect Prediction
Robert M. Hierons
◽
Tao Xie
2020 ◽
Vol 16
(11)
◽
pp. 1771
Wang Shibo
◽
Li Yong
◽
Mi Wenbo
◽
Liu Ying
Y. Xia
◽
G. Y. Yan
◽
H. Y. Zhang
2009 ◽
Vol 4
(2)
◽
pp. 7-15
2011 ◽
Vol 34
(6)
◽
pp. 1148-1154
◽
Hui-Yan JIANG
◽
Mao ZONG
◽
Xiang-Ying LIU
Sonali Srivastava
◽
Shikha Rani
◽
Shailly Singh
◽
Saurabh Singh
◽
Rohit Vashisht
2019 ◽
Vol 28
(5)
◽
pp. 925-932
Hua WEI
◽
Chun SHAN
◽
Changzhen HU
◽
Yu ZHANG
◽
Xiao YU
2020 ◽
Vol 126
◽
pp. 106364
Weiwei Li
◽
Wenzhou Zhang
◽
Xiuyi Jia
◽
Zhiqiu Huang
2021 ◽
Vol 1948
(1)
◽
pp. 012019
Xu De-Jian
◽
Yu Yong-Peng
2021 ◽
Vol 137
◽
pp. 106588
Quanyi Zou
◽
Lu Lu
◽
Zhanyu Yang
◽
Xiaowei Gu
◽
Shaojian Qiu
Md Alamgir Kabir
◽
Jacky W. Keung
◽
Kwabena E. Bennin
◽
Miao Zhang