An X-ray fluorescence method for coating thickness measurement

1979 ◽  
Vol 8 (1) ◽  
pp. 11-13 ◽  
Author(s):  
S. K. Jain ◽  
P. P. Gupta ◽  
A. C. Eapen
Keyword(s):  
Coating Thickness ◽  
Thickness Measurement ◽  
Fluorescence Method ◽  
X Ray ◽  
Coating Thickness Measurement

scholarly journals Portable x-ray fluorescence spectrometer for coating thickness measurement

2007 ◽  
Vol 78 (12) ◽  
pp. 123109 ◽  
Author(s):  
Alain Carapelle ◽  
Karl Fleury-Frenette ◽  
Jean-Paul Collette ◽  
Henri-Pierre Garnir ◽  
Philippe Harlet
Keyword(s):  
Coating Thickness ◽  
Thickness Measurement ◽  
X Ray ◽  
Coating Thickness Measurement ◽  
Fluorescence Spectrometer

Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-Rays

1968 ◽  
Vol 12 ◽  
pp. 446-456 ◽  
Author(s):  
Toshio Shiraiwa ◽  
Nobukatsu Fujino
Keyword(s):  
Film Thickness ◽  
Coating Thickness ◽  
Thickness Measurement ◽  
Enhancement Effect ◽  
X Rays ◽  
Ray Method ◽  
X Ray ◽  
Coating Thickness Measurement ◽  
Film Thickness Measurement ◽  
Theoretical Results

AbstractThe fluorescence x-ray method of the coating thickness measurement is theoretically studied. The theoretical formulas of the fluorescence x-ray intensity from the coating and from the substrate are obtained which include the enhancement effect between the coating and the substrate. The formulas are applied to the following examples and are confirmed experimentally: zinc on steel; tin on steel; aluminum on steel and on PMMA. The experimental results agree well with the theoretical results.

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