Mass Determination by Inelastic Electron Scattering in an Energy-Filtering Transmission Electron Microscope with Slow-Scan CCD Camera

1997 ◽  
Vol 119 (1) ◽  
pp. 72-82 ◽  
Author(s):  
Bernhard Feja ◽  
Markus Dürrenberger ◽  
Shirley Müller ◽  
Rudolf Reichelt ◽  
Ueli Aebi
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Scattering ◽  
Ccd Camera ◽  
Inelastic Electron ◽  
Mass Determination ◽  
Energy Filtering ◽  
Inelastic Electron Scattering ◽  
Transmission Electron

Analysis of Diffraction Contrast as A Function of Energy Loss in Energy Filtering Transmission Electron Microscope (EFTEM) Imaging and Possible Implications on High-Resolution Compositional Mapping

1999 ◽  
Vol 5 (S2) ◽  
pp. 620-621
Author(s):  
K.T. Moore ◽  
J.M. Howe
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Transmission Electron Microscope ◽  
Diffraction Contrast ◽  
Energy Filtering ◽  
Background Removal ◽  
Transmission Electron ◽  
Important Relationship ◽  
Electron Energy Loss

The dependence of diffraction contrast on electron energy loss is an important relationship that needs to be understood because of its potential effect on energy-filtering transmission electron microscope (EFTEM) images. Often when either a two-window jump-ratio image or a three-window elemental map is produced diffraction contrast is not totally eliminated and contributes to the intensity of the final EFTEM image. Background removal procedures often are unable to completely account for intensity changes due to dynamical effects (i.e., elastic scattering) that occur between images acquired at different energy losses, leaving artifacts in the final EFTEM image.In this study, the relationship between diffraction contrast and electron energy loss was investigated by obtaining EFTEM images of a bend contour in aluminum in 100 eV increments from 0 to 1000 eV (Fig. 1). EFTEM images were acquired a JOEL 2010F FEG TEM with a Gatan imaging filter (GIF) at a microscope magnification of 8 kX using a 1 eV/pixel dispersion, 2X binning (512 x 512) and exposure times ranging from 0.25 s for 0 eV energy loss up to 132 sec for 1000 eV energy loss.

Quantitative Analysis Of Bological Specimens by Spectrum-Imaging in the Energy Filtering Transmission Electron Microscope

2000 ◽  
Vol 6 (S2) ◽  
pp. 160-161
Author(s):  
R.D. Leapman ◽  
C.M. Brooks ◽  
N.W. Rizzo ◽  
T.L. Talbot
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Beam Current ◽  
Scanning Transmission Electron Microscope ◽  
Accurate Analysis ◽  
Energy Filtering ◽  
Inverse Power Law ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Spectrum Imaging

Electron energy loss spectrum-imaging (EELSI) in the energy filtering transmission electron microscope (EFTEM) can provide more accurate analysis of elemental distributions than that obtainable by the standard two-window or three-window background subtraction techniques. Spectra containing many channels can be extracted from regions of interest and analyzed using established methods for quantitation. For example, the pre-edge background can be fitted by an inverse power law and subtracted from the post-edge spectrum. EELSI in the EFTEM is often superior to spectrum-imaging in the scanning transmission electron microscope for mapping specimen regions of size greater than 1 μm. This is due the much larger total beam current that is available at the specimen in a fixed-beam microscope relative to a scanned-beam microscope. Our aim here is demonstrate the advantages of such EELSI measurements for analysis of biological specimens. However, we also indicate some potential pitfalls in acquiring elemental maps in the EFTEM, which can be attributed to specimen instabilities during the acquisition.

Investigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope

2012 ◽  
Vol 186 ◽  
pp. 53-57 ◽  
Author(s):  
Magdalena Bieda
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Quantitative Description ◽  
Ccd Camera ◽  
Microscopic Investigation ◽  
Automated System ◽  
Fine Grained ◽  
Transmission Electron ◽  
Orientation Maps ◽  
Diffraction Patterns

New subdivision of microscopic investigation called Orientation Microscopy (OM) is already well known in scanning electron microscope (SEM). Needs for investigation in nanoscale contribute to development of an appropriate method for transmission electron microscope (TEM). Automated acquisition and indexing of diffraction patterns, necessary for creation of orientation maps in TEM, cause more difficulties then in SEM. Nevertheless, the techniques of OM are also being developed in the Transmission Electron Microscope (TEM). Microdiffraction has been successfully introduced for creating such maps. Individual orientation measurements, which appeared in the convergent beam mode, can be used for quantitative description of microstructure of fine grained and deformed materials. The idea of the operation of the automated system in transmission electron microscope (TEM) which is developed in IMIM PAS relies on an automatic (with control position of the beam) acquisition of diffraction patterns using digital CCD camera, and indexing them, and then on the analysis of the set of individual crystallographic orientations. The graphic presentation of received sets of orientation can be analysed in order to obtain parameters and characteristics such as texture characteristics, characteristics of grain boundaries (based on orientation relationship) or the stereological characteristics. To illustrate application of this system, orientation maps measured in cold-rolled polycrystalline aluminium and its alloy 6013, and in multi-phase alloys of Fe-Cr-Co system after severe plastic deformation are presented.

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