Geometrical and Topological Characterization of Cork Cells by Digital Image Analysis

Author(s):  
Pedro Pina ◽  
Nazha Selmaoui ◽  
Manuel Amaral Fortes
Author(s):  
Rosinei Batista ◽  
Gilbert Silva ◽  
Antnio Henriques Araujo ◽  
Nelson Tavares ◽  
Jos Wilson De Jesus Silva ◽  
...  

1992 ◽  
Vol 31 (8) ◽  
pp. 1083
Author(s):  
Rajeeb Hazra ◽  
Charles L. Viles ◽  
Stephen K. Park ◽  
Stephen E. Reichenbach ◽  
Michael E. Sieracki

Mycologia ◽  
2001 ◽  
Vol 93 (5) ◽  
pp. 864 ◽  
Author(s):  
Charlotte Nielsen ◽  
Christian Sommer ◽  
Jorgen Eilenberg ◽  
Karen S. Hansen ◽  
Richard A. Humber

2019 ◽  
Vol 8 (2) ◽  
pp. 147-161
Author(s):  
Anisa Lailatusy Syarifah ◽  
◽  
Rurini Retnowati ◽  
Hermin Sulistyarti

Curcuma longa, C. xanthorrhiza, C. heyneana, and Zingiber cassumunar contain high curcuminoid and have relatively similar yellow color. Therefore, they are potentially adulterated and difficult to differentiate in the form of powder. Hence, it is necessary to characterize the fingerprints compound profile by a simple and rapid method. This research aims to determine fingerprint compound profile of curcuminoid using Thin Layer Chromatography (TLC) and digital image analysis. The result of the research identified that the fingerprint compound profile of curcuminoid on the four rhizomes was obtained by TLC method using silica gel 60 GF254 as the stationary phase, chloroform: dichloromethane: methanol (13:6:1) as the mobile phase, and observation under UV 254 nm light and citroborate reagent. Thereafter, the digital image analysis was carried out using Image J software according to the gray value and % of RGB (red-green-blue) value. Based on gray value and % of RGB, both Curcuma and Zingiber genera were differentiated through curcumin compound (Rf 0.63), demethoxycurcumin (Rf 0.34), bisdemethoxycurcumin (Rf 0.21). The profile of fingerprint compound on Curcuma longa, C. xanthorrhiza, C. heyneana, and Zingiber cassumunar was differentiated through Rf 0.26; Rf 0.17; and Rf 0.10.


1994 ◽  
Vol 338 ◽  
Author(s):  
Yolanda J. Kime ◽  
Peter Grach

ABSTRACTThe areas, perimeters, lengths, and widths of 998 electromigration induced voids on 38 test stripes have been measured by SEM and digital image analysis. Virtually all of the voids occurred along the passivation-conductor interface on the side of the stripe. Plots of number of voids or total void area versus time to failure do not extrapolate to zero voids at zero time to failure which suggests there is a certain number of active nucleation sites predisposed to voiding.


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