Electrical Characterization of Interface States at Schottky Contacts and MIS Tunnel Diodes

Author(s):  
Jürgen H. Werner
2018 ◽  
Vol 20 (48) ◽  
pp. 30502-30513 ◽  
Author(s):  
Emine Karagöz ◽  
Songül Fiat Varol ◽  
Serkan Sayın ◽  
Ziya Merdan

The aim of this study was to analyze the interface states (Nss) in pure Al//p-Si/Al, Al/N-F Nft/p-Si/Al and Al/N-T Nft/p-Si/Al Schottky barrier diodes (SBDs).


2006 ◽  
Vol 89 (24) ◽  
pp. 242117 ◽  
Author(s):  
H. B. Yao ◽  
D. Z. Chi ◽  
R. Li ◽  
S. J. Lee ◽  
D.-L. Kwong

2013 ◽  
Vol 86 ◽  
pp. 17-21 ◽  
Author(s):  
B.P. Downey ◽  
D.J. Meyer ◽  
D.S. Katzer ◽  
D.F. Storm ◽  
S.C. Binari

2010 ◽  
Vol 7 (7-8) ◽  
pp. 2007-2009 ◽  
Author(s):  
Yoshitaka Nakano ◽  
Nobuyuki Matsuki ◽  
Yoshihiro Irokawa ◽  
Masatomo Sumiya

2013 ◽  
Vol 104 ◽  
pp. 95-99 ◽  
Author(s):  
M. Stamataki ◽  
D. Tsamakis ◽  
J.P. Xanthakis ◽  
H.A. Ali ◽  
S. Esmaili-Sardari ◽  
...  

2006 ◽  
Vol 504 (1-2) ◽  
pp. 149-152 ◽  
Author(s):  
L.J. Jin ◽  
K.L. Pey ◽  
W.K. Choi ◽  
D.A. Antoniadis ◽  
E.A. Fitzgerald ◽  
...  

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