Novel Approaches to Engineering Disease Resistance in Crops

Genetic Engineering ◽

10.1007/978-1-4615-5925-2_1 ◽

1997 ◽

pp. 1-13 ◽

Cited By ~ 5

Author(s):

Kathy M. M. Swords ◽

Jihong Liang ◽

Dilip M. Shah

Keyword(s):

Disease Resistance ◽

Novel Approaches

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Novel approaches to improving disease resistance in plants

Biotechnology for Solving Agricultural Problems ◽

10.1007/978-94-009-4396-4_17 ◽

1986 ◽

pp. 223-236

Author(s):

N. T. Keen

Keyword(s):

Disease Resistance ◽

Novel Approaches

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Novel approaches to enhance disease resistance in ruminants?—Breeding for geographically important TLR SNPs

Veterinary Immunology and Immunopathology ◽

10.1016/j.vetimm.2008.10.008 ◽

2009 ◽

Vol 128 (1-3) ◽

pp. 212

Author(s):

DW Burt ◽

T.J. Coffey ◽

S. Chang ◽

E.J. Glass ◽

D. Haig ◽

...

Keyword(s):

Disease Resistance ◽

Novel Approaches

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Novel Approaches to Low-Voltage Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180586 ◽

1990 ◽

Vol 48 (1) ◽

pp. 366-367

Author(s):

Arthur V. Jones

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Electron Optics ◽

Current Interest ◽

New Concepts ◽

Opportune Time ◽

Novel Approaches ◽

Voltage Scanning ◽

Scanning Electron

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.

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