Two-Dimensional Conductivity of Thin Inhomogeneous Gold Films

1991 ◽  
pp. 85-90
Author(s):  
Günter Dumpich ◽  
Axel Carl
Keyword(s):  
Gold Films ◽  
Two Dimensional

Low loss ultra-smooth gold films for two-dimensional material plasmonic devices

2021 ◽  
Author(s):  
Jie Luo ◽  
Chunchao Wen ◽  
Zhihong Zhu ◽  
Jianfa Zhang
Keyword(s):  
Gold Films ◽  
Two Dimensional ◽  
Low Loss

Frequency-independent parameters of an equivalent circuit of two dimensional island gold films

2003 ◽  
Vol 199 (3) ◽  
pp. 475-483 ◽  
Author(s):  
A. G. Bishay ◽  
W. Fikry ◽  
H. Hunter ◽  
H. F. Ragai
Keyword(s):  
Equivalent Circuit ◽  
Gold Films ◽  
Two Dimensional ◽  
Frequency Independent ◽  
Independent Parameters

The Anomalous Infrared Transmission of Gold Films on Two-Dimensional Colloidal Crystals

2006 ◽  
Vol 18 (12) ◽  
pp. 1612-1616 ◽  
Author(s):  
P. Zhan ◽  
Z. L. Wang ◽  
H. Dong ◽  
J. Sun ◽  
J. Wu ◽  
...  
Keyword(s):  
Colloidal Crystals ◽  
Gold Films ◽  
Two Dimensional ◽  
Infrared Transmission

Mesoscopic conductance fluctuations in two-dimensional percolation gold films near the percolation threshold

1996 ◽  
Vol 46 (S4) ◽  
pp. 2363-2364
Author(s):  
Boris I. Belevtsev ◽  
Evgeniy Yu. Beliayev ◽  
Evgeniy Y. Kopeichenko
Keyword(s):  
Percolation Threshold ◽  
Gold Films ◽  
Two Dimensional ◽  
Conductance Fluctuations

Room-temperature growth of two-dimensional gold films on GaAs(001)

1987 ◽  
Vol 36 (11) ◽  
pp. 6231-6234 ◽  
Author(s):  
T. G. Andersson ◽  
G. Le Lay ◽  
J. Kanski ◽  
S. P. Svensson
Keyword(s):  
Room Temperature ◽  
Gold Films ◽  
Two Dimensional ◽  
Temperature Growth

Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior

2008 ◽  
Vol 41 (6) ◽  
pp. 1076-1088 ◽  
Author(s):  
Guillaume Geandier ◽  
Pierre-Olivier Renault ◽  
Simon Teat ◽  
Eric Le Bourhis ◽  
Bruno Lamongie ◽  
...  
Keyword(s):  
Thin Film ◽  
Tensile Testing ◽  
Gold Films ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Reflection And Transmission ◽  
Strain Measurements ◽  
X Ray ◽  
Polycrystalline Thin Films

Performing a completein situmechanical property analysis of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two-dimensional detection is shown to enable relatively fast and reliable X-ray strain measurements duringin situtensile testing of gold films deposited on polyimide substrates. Advantages and drawbacks in the use of two-dimensional detectors for this type of analysis are discussed for two commonly used geometries: reflection and transmission.

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