scholarly journals Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements

2009 ◽  
pp. 1817-1851 ◽  
Author(s):  
Thibault Candela ◽  
François Renard ◽  
Michel Bouchon ◽  
Alexandre Brouste ◽  
David Marsan ◽  
...  
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
Fault Roughness

scholarly journals Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements

2009 ◽  
Vol 166 (10-11) ◽  
pp. 1817-1851 ◽  
Author(s):  
Thibault Candela ◽  
François Renard ◽  
Michel Bouchon ◽  
Alexandre Brouste ◽  
David Marsan ◽  
...  
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
Fault Roughness

Three dimensional characterization of laser ablation craters using high resolution X-ray computed tomography

2018 ◽  
Vol 139 ◽  
pp. 75-82 ◽  
Author(s):  
A.H. Galmed ◽  
A. du Plessis ◽  
S.G. le Roux ◽  
E. Hartnick ◽  
H. Von Bergmann ◽  
...  
Keyword(s):  
Computed Tomography ◽  
Laser Ablation ◽  
High Resolution ◽  
Three Dimensional ◽  
X Ray ◽  
X Ray Computed

Three-dimensional characterization of ‘as-cast’ and solution-treated AlSi12(Sr) alloys by high-resolution FIB tomography

2007 ◽  
Vol 55 (11) ◽  
pp. 3875-3882 ◽  
Author(s):  
F. Lasagni ◽  
A. Lasagni ◽  
E. Marks ◽  
C. Holzapfel ◽  
F. Mücklich ◽  
...  
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
Solution Treated

scholarly journals Three-dimensional characterization of strain localization bands in high-resolution elastoplastic polycrystals

2009 ◽  
Vol 36 (7) ◽  
pp. 762-768 ◽  
Author(s):  
Fabrice Barbe ◽  
Romain Quey ◽  
Andrei Musienko ◽  
Georges Cailletaud
Keyword(s):  
High Resolution ◽  
Strain Localization ◽  
Three Dimensional

Theoretical Modeling and Experimental Characterization of Planar Defects in Y2Ba4Cu6+Xo14+X

1990 ◽  
Vol 209 ◽  
Author(s):  
C.P. Burmester ◽  
M. Fendorf ◽  
L.T. Wille ◽  
R. Gronsky
Keyword(s):  
Monte Carlo ◽  
High Resolution ◽  
Three Dimensional ◽  
Transformation Mechanism ◽  
Planar Defects ◽  
Transmission Electron ◽  
High Resolution Images ◽  
Equilibrium Structures ◽  
Crystallographic Defects

Crystallographic defects and phase transformations in the system Y2Ba4Cu6+xO14+x(0≤≤4) are investigated by high resolution transmission electron microscopy (TEM) and static lattice, three dimensional Monte Carlo computer simulations. High resolution images of partially transformed (x=2 to x=l) material reveal a prevalence of CuO planar defects (stackingfaults) associated with the transformation and an absence of disturbance to the perovskite Ba-Y-Ba blocks. An atomic mechanism involving the intercalation and removal of extra CuO planes by partial dislocation climb, and requiring only a-b plane diffusion, is developed for the formation of such planar defects during changes in the layered YBaCuO crystal structure. Monte Carlo simulations based on the proposed transformation mechanism accurately reproduce the observed defects andknown equilibrium structures.

Sign in / Sign up

Export Citation Format

Share Document