High resolution three-dimensional visualization and characterization of coronary atherosclerosisin vitroby synchrotron radiation x-ray microtomography and highly localized x-ray diffraction

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

Download Full-text

Three dimensional characterization of laser ablation craters using high resolution X-ray computed tomography

Spectrochimica Acta Part B Atomic Spectroscopy ◽

10.1016/j.sab.2017.11.011 ◽

2018 ◽

Vol 139 ◽

pp. 75-82 ◽

Cited By ~ 4

Author(s):

A.H. Galmed ◽

A. du Plessis ◽

S.G. le Roux ◽

E. Hartnick ◽

H. Von Bergmann ◽

...

Keyword(s):

Computed Tomography ◽

Laser Ablation ◽

High Resolution ◽

Three Dimensional ◽

X Ray ◽

X Ray Computed

Download Full-text

High-resolution characterization of the forbidden Si 200 and Si 222 reflections

Journal of Applied Crystallography ◽

10.1107/s1600576715004732 ◽

2015 ◽

Vol 48 (2) ◽

pp. 528-532 ◽

Cited By ~ 77

Author(s):

Peter Zaumseil

Keyword(s):

High Resolution ◽

Angular Range ◽

Angular Divergence ◽

X Ray Diffraction ◽

Multiple Diffraction ◽

Diffraction Plane ◽

X Ray ◽

Sample Orientation ◽

Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

Download Full-text

Applications of High-Resolution Powder X-Ray Diffraction

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.130.7 ◽

2007 ◽

Vol 130 ◽

pp. 7-14 ◽

Cited By ~ 4

Author(s):

Andrew N. Fitch

Keyword(s):

High Resolution ◽

Synchrotron Radiation ◽

Powder Diffraction ◽

X Rays ◽

X Ray Diffraction ◽

Crystalline Materials ◽

X Ray ◽

Structural Characterisation ◽

Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Download Full-text