Methods to Evaluate Spatial Uniformity in Porous Silicon

2016 ◽  
pp. 1-18 ◽  
Author(s):  
Gordon M. Miskelly
1993 ◽  
Vol 03 (C5) ◽  
pp. 355-358 ◽  
Author(s):  
G. FISHMAN ◽  
R. ROMESTAIN ◽  
J. C. VIAL

Author(s):  
E. A. Gosteva ◽  
V. V. Starkov ◽  
Yu. N. Parhomenko ◽  
M. O. Kah ◽  
I. A. Iwe
Keyword(s):  

2015 ◽  
Vol 30 (4) ◽  
pp. 351 ◽  
Author(s):  
HUANG Yan-Hua ◽  
HAN Xiang ◽  
CHEN Hui-Xin ◽  
CHEN Song-Yan ◽  
YANG Yong

2003 ◽  
Vol 762 ◽  
Author(s):  
Claudio J. Oton ◽  
Zeno Gaburro ◽  
Mher Ghulinyan ◽  
Nicola Daldosso ◽  
Lucio Pancheri ◽  
...  

AbstractWe report the observation of strongly anisotropic scattering of laser light at oblique incidence on (100)-oriented porous silicon layers. We performed angle-resolved light scattering measurements and three concentric rings were observed. Modeling porous silicon by means of nanometric columnar air pores and an effective anisotropic uniaxial dielectric constant explains the observed phenomenon, and besides, the observation of the angle aperture of these rings allows a direct measurement of relative birefringence. We finally study the changes of optical anisotropy after different modifications of the structure.


Author(s):  
Vitaly N. Mironov ◽  
Oleg G. Penyazkov ◽  
P. N. Krivosheyev ◽  
Y. A. Baranyshyn ◽  
E. S. Golomako ◽  
...  

PIERS Online ◽  
2009 ◽  
Vol 5 (2) ◽  
pp. 167-170 ◽  
Author(s):  
Jose Escorcia-García ◽  
Miguel Eduardo Mora-Ramos

Sign in / Sign up

Export Citation Format

Share Document