Monte-Carlo Simulation and Availability Assessment of the Smart Building Automation Systems Considering Component Failures and Attacks on Vulnerabilities

2018 ◽  
pp. 270-280
Author(s):  
Vyacheslav Kharchenko ◽  
Yuriy Ponochovnyi ◽  
Artem Boyarchuk ◽  
Eugene Brezhnev ◽  
Anton Andrashov
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Building Automation ◽  
Smart Building ◽  
Automation Systems ◽  
Component Failures ◽  
Availability Assessment

scholarly journals SECURITY AND AVAILABILITY MODELS FOR SMART BUILDING AUTOMATION SYSTEMS

2017 ◽  
pp. 194-202 ◽  
Author(s):  
Vyacheslav Kharchenko ◽  
Yuriy Ponochovnyi ◽  
Al-Sudani Mustafa Qahtan Abdulmunem ◽  
Artem Boyarchuk
Keyword(s):  
Markov Models ◽  
Life Time ◽  
Automation System ◽  
Building Automation ◽  
Software Defects ◽  
Smart Building ◽  
Automation Systems ◽  
Building Automation System ◽  
General Reliability ◽  
Architecture Component

This article presents the information on control system of smart building, which is considered as a set of subsystems including a building automation system. The paper considers the three-level architecture of the building automation system components, including FPGA, communication and management levels. It is determined that the causes of failures and inaccessibility of the BAS architecture component can be both internal system and external factors, among which software defects and vulnerabilities are identified. BAS security and availability during its life cycle are assessed using the Fault-, Attack- and Availability-Tree and Markov models. Markov model is used to develop a number of strategies which help to recover system and to eliminate all the possible threats during systems life time. The models of BAS architecture with software defects and attacked vulnerabilities with general reliability (defect) and security (vulnerability) maintenance are analyzed in detail. The recommendations on the choice of strategies and service parameters are given.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

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