Families of Simultaneous Methods of Higher Order: Part I

1961 ◽  
Vol 39 (1) ◽  
pp. 1-12 ◽  
Author(s):  
M. A. Clark ◽  
J. M. Robson

A single crystal of Co–Fe alloy is being used to produce a diffracted beam of neutrons with a flux of 2.6 × 106 n/sq. cm sec over an area of 1.5 in. by 1.5 in. This beam contains 92 ± 5% first-order neutrons (λ = 1.37 Å, E = 0.0436 ev), 3 ± 5% second- and higher-order neutrons, and 5% incoherently scattered neutrons. The first-order part of the beam has a polarization of 0.98 ±.01; the second-order part of the beam has a polarization of 0.36 ±.03 in the same direction as the first-order part, and the over-all beam has a polarization of 0.92 ±.05. The neutron spins can be reversed by the magnetic resonance technique with flipping efficiencies of 98% for the first order and 97% for the over-all beam.


2003 ◽  
Vol 80 (11) ◽  
pp. 1407-1427 ◽  
Author(s):  
M. S. Petković ◽  
L. D. Petković ◽  
L. Rančić

2019 ◽  
Vol 42 ◽  
Author(s):  
Daniel J. Povinelli ◽  
Gabrielle C. Glorioso ◽  
Shannon L. Kuznar ◽  
Mateja Pavlic

Abstract Hoerl and McCormack demonstrate that although animals possess a sophisticated temporal updating system, there is no evidence that they also possess a temporal reasoning system. This important case study is directly related to the broader claim that although animals are manifestly capable of first-order (perceptually-based) relational reasoning, they lack the capacity for higher-order, role-based relational reasoning. We argue this distinction applies to all domains of cognition.


Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers

Among the ultra-light elements B, C, N, and O nitrogen is the most difficult element to deal with in the electron probe microanalyzer. This is mainly caused by the severe absorption that N-Kα radiation suffers in carbon which is abundantly present in the detection system (lead-stearate crystal, carbonaceous counter window). As a result the peak-to-background ratios for N-Kα measured with a conventional lead-stearate crystal can attain values well below unity in many binary nitrides . An additional complication can be caused by the presence of interfering higher-order reflections from the metal partner in the nitride specimen; notorious examples are elements such as Zr and Nb. In nitrides containing these elements is is virtually impossible to carry out an accurate background subtraction which becomes increasingly important with lower and lower peak-to-background ratios. The use of a synthetic multilayer crystal such as W/Si (2d-spacing 59.8 Å) can bring significant improvements in terms of both higher peak count rates as well as a strong suppression of higher-order reflections.


Author(s):  
H. S. Kim ◽  
S. S. Sheinin

The importance of image simulation in interpreting experimental lattice images is well established. Normally, in carrying out the required theoretical calculations, only zero order Laue zone reflections are taken into account. In this paper we assess the conditions for which this procedure is valid and indicate circumstances in which higher order Laue zone reflections may be important. Our work is based on an analysis of the requirements for obtaining structure images i.e. images directly related to the projected potential. In the considerations to follow, the Bloch wave formulation of the dynamical theory has been used.The intensity in a lattice image can be obtained from the total wave function at the image plane is given by: where ϕg(z) is the diffracted beam amplitide given by In these equations,the z direction is perpendicular to the entrance surface, g is a reciprocal lattice vector, the Cg(i) are Fourier coefficients in the expression for a Bloch wave, b(i), X(i) is the Bloch wave excitation coefficient, ϒ(i)=k(i)-K, k(i) is a Bloch wave vector, K is the electron wave vector after correction for the mean inner potential of the crystal, T(q) and D(q) are the transfer function and damping function respectively, q is a scattering vector and the summation is over i=l,N where N is the number of beams taken into account.


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