Availability Analysis of a Repairable System Through Computer Simulation

1989 ◽  
pp. 97-101
Author(s):  
K. C. Kurien ◽  
G. S. Sekhon ◽  
O. P. Chawla
Keyword(s):  
Computer Simulation ◽  
Repairable System ◽  
Availability Analysis

scholarly journals Reliability and Availability Analysis of Arepairable System With Two Types of Failure

2015 ◽  
Vol 4 (1) ◽  
pp. 39
Author(s):  
M. A. El-Damcese ◽  
M. S. Shama
Keyword(s):  
System Reliability ◽  
Repairable System ◽  
Time To Failure ◽  
Repair Rate ◽  
System Parameters ◽  
Availability Analysis ◽  
Reliability Characteristics ◽  
The Mean ◽  
Mean Time ◽  
Reliability And Availability

This paper investigates reliability and availability of a repairable system with two types of failure. Let failure rate and repair rate of [type1, type2] components are assumed to be exponentially distributed. The expressions of availability and reliability characteristics such as the system reliability and the mean time to failure are derived. We used several cases to analyze graphically the effect of various system parameters on the reliability system and availability system.

Reliability Analysis of Repairable System With Multiple-Input and Multi-Function Component Based on GO Methodology

2015 ◽  
Author(s):  
Xiaojian Yi ◽  
Jian Shi ◽  
Huina Mu ◽  
Haiping Dong ◽  
Zhong Zhang
Keyword(s):  
Reliability Analysis ◽  
Control Valve ◽  
Electrical Signal ◽  
Repairable System ◽  
Repairable Systems ◽  
Availability Analysis ◽  
Quantitative Calculation ◽  
Comparison Results ◽  
Multiple Input ◽  
Go Methodology

GO methodology is a success-oriented method for system reliability analysis. There are Multiple-Input, which contain control signal, oil provided and electrical signal et.al and MultiFunction Components (MIMFC) in some repairable systems, such as double-action variable displacement pump, multiple directional control valve, and hydraulic coupler etc. Because existing 17 basic GO operators in GO methodology can’t describe these MIMFCs accurately, it is a problem to adopt existing GO methodology to conduct the reliability analysis for these systems with MIMFC. In this paper, firstly a new GO operator combination, which is composed of a new function GO operator and a new auxiliary GO operator, is created to represent MIMFC. The new function GO operator named as Type 22 operator is created to represent MIMFC itself, and the auxiliary GO operator named as Type 15B operator is created to represent multi-conditions control signals of MIMFC. Then, quantitative calculation formulas of new GO operator combination are derived based on logical relationships among inputs, outputs, and component itself. Thirdly, this new GO operator combination is applied for the first time in steady availability analysis and qualitative analysis of the fan drive system of a Power-shift Steering Transmission. Finally, the results obtained by the method in this paper are compared with the result of Fault Tree Analysis (FTA) and result of Monte Carlo simulation, and the comparison results show that this new GO operator combination is usable and correct for reliability analysis of repairable system with MIMFC, and it has more advantageous in the aspects of building system model and quantitative analysis. Meantime, this paper provides guidance for reliability analysis of other repairable systems with MIMFC.

Characterization of Modulated Structure Through Structure Images and their Computer Simulation

1990 ◽  
Vol 48 (1) ◽  
pp. 70-71
Author(s):  
Kiyomichi Nakai ◽  
Yusuke Isobe ◽  
Chiken Kinoshita ◽  
Kazutoshi Shinohara
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Basic Mechanism ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Transmitted Beam ◽  
Modulated Structure ◽  
Resolution Electron

Induced spinodal decomposition under electron irradiation in a Ni-Au alloy has been investigated with respect to its basic mechanism and confirmed to be caused by the relaxation of coherent strain associated with modulated structure. Modulation of white-dots on structure images of modulated structure due to high-resolution electron microscopy is reduced with irradiation. In this paper the atom arrangement of the modulated structure is confirmed with computer simulation on the structure images, and the relaxation of the coherent strain is concluded to be due to the reduction of phase-modulation.Structure images of three-dimensional modulated structure along <100> were taken with the JEM-4000EX high-resolution electron microscope at the HVEM Laboratory, Kyushu University. The transmitted beam and four 200 reflections with their satellites from the modulated structure in an fee Ni-30.0at%Au alloy under illumination of 400keV electrons were used for the structure images under a condition of the spherical aberration constant of the objective lens, Cs = 1mm, the divergence of the beam, α = 3 × 10-4 rad, underfocus, Δf ≃ -50nm and specimen thickness, t ≃ 15nm. The CIHRTEM code was used for the simulation of the structure image.

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