Alpha-Recoil and Fission Fragment Induced Desorption of Secondary Ions

1979 ◽  
pp. 281-284 ◽  
Author(s):  
O. Becker ◽  
W. Knippelberg ◽  
D. Nederveld ◽  
K. Wien
Keyword(s):  
Fission Fragment ◽  
Secondary Ions

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Scanning ion microscopy images

1987 ◽  
Vol 45 ◽  
pp. 180-181
Author(s):  
R. Levi-Setti ◽  
J.M. Chabala ◽  
Y.L. Wang
Keyword(s):  
Metal Ion ◽  
Secondary Emission ◽  
Scanning Method ◽  
Ion Channeling ◽  
Secondary Ions ◽  
High Resolution Images ◽  
Ion Microscopy ◽  
Z Contrast ◽  
Focused Beams ◽  
Microscopy Images

Finely focused beams extracted from liquid metal ion sources (LMIS) provide a wealth of secondary signals which can be exploited to create high resolution images by the scanning method. The images of scanning ion microscopy (SIM) encompass a variety of contrast mechanisms which we classify into two broad categories: a) Emission contrast and b) Analytical contrast.Emission contrast refers to those mechanisms inherent to the emission of secondaries by solids under ion bombardment. The contrast-carrying signals consist of ion-induced secondary electrons (ISE) and secondary ions (ISI). Both signals exhibit i) topographic emission contrast due to the existence of differential geometric emission and collection effects, ii) crystallographic emission contrast, due to primary ion channeling phenomena and differential oxidation of crystalline surfaces, iii) chemical emission or Z-contrast, related to the dependence of the secondary emission yields on the Z and surface chemical state of the target.

scholarly journals Fission fragment distributions and their impact on the r -process nucleosynthesis in neutron star mergers

2021 ◽  
Vol 103 (2) ◽  
Author(s):  
J.-F. Lemaître ◽  
S. Goriely ◽  
A. Bauswein ◽  
H.-T. Janka
Keyword(s):  
Neutron Star ◽  
Fission Fragment ◽  
R Process

scholarly journals Correlation studies of fission-fragment neutron multiplicities

2021 ◽  
Vol 103 (1) ◽  
Author(s):  
M. Albertsson ◽  
B. G. Carlsson ◽  
T. Døssing ◽  
P. Möller ◽  
J. Randrup ◽  
...  
Keyword(s):  
Fission Fragment ◽  
Correlation Studies ◽  
Neutron Multiplicities

scholarly journals Correlation measurements of fission-fragment properties

2010 ◽  
Vol 8 ◽  
pp. 03005 ◽  
Author(s):  
S. Oberstedt ◽  
T. Belgya ◽  
R. Billnert ◽  
R. Borcea ◽  
D. Cano-Ott ◽  
...  
Keyword(s):  
Fission Fragment

On the electron microscopy of fission fragment damage

1966 ◽  
Vol 13 (121) ◽  
pp. 185-195 ◽  
Author(s):  
L. T. Chadderton ◽  
D. V. Morgan ◽  
I. McC. Torrens ◽  
D. Van Vliet
Keyword(s):  
Electron Microscopy ◽  
Fission Fragment

FISSION TIME OF α-INDUCED REACTIONS MEASURED BY THE CRYSTAL BLOCKING TECHNIQUE

2010 ◽  
Vol 19 (05n06) ◽  
pp. 1227-1235 ◽  
Author(s):  
V. A. DROZDOV ◽  
D. O. EREMENKO ◽  
O. V. FOTINA ◽  
S. Yu. PLATONOV ◽  
O. A. YUMINOV ◽  
...  
Keyword(s):  
Fission Fragment ◽  
Statistical Approach ◽  
Reliable Information ◽  
Fission Barrier ◽  
Large Set ◽  
Angular Anisotropy ◽  
Excitation Energies ◽  
Shell Effects ◽  
Pu Isotopes ◽  
Nuclear Dissipation

A large set of experimental observables for the 232 Th , 235 U (α, xnf ) reactions has been analyzed within the dynamic-statistical approach with allowance for the nuclear dissipation phenomenon, the double humped structure of fission barrier, and also the temperature damping of shell effects. The energy dependences of the lifetime effect (experimentally measured by the crystal blocking technique) along the corresponding data on the fission fragment angular anisotropy and also fission probabilities of U and Pu isotopes produced in the reactions were chosen for the analysis. Reliable information on the nuclear viscosity at the low excitation energies (< 30 MeV) was obtained.

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