3D Knife-edge Characterization of Two-Photon Absorption Volume in Silicon for Integrated Circuit Testing
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2020 ◽
Vol 1003
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pp. 165-172
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2021 ◽
Vol 249
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pp. 119291
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2005 ◽
Vol 44
(No. 21)
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pp. L665-L667
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2005 ◽
Vol 14
(03)
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pp. 319-329
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2013 ◽
Vol 46
(1)
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pp. 165-170
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