Micro-Raman Spectroscopy for Phase Identification and Stress Measurement in Advanced Ceramics

1994 ◽  
pp. 385-397 ◽  
Author(s):  
O. Van Der Biest ◽  
T. Laoui ◽  
J. Vleugels ◽  
K. Sumanasiri ◽  
H. Mohrbacher ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Stress Measurement ◽  
Phase Identification ◽  
Advanced Ceramics ◽  
Micro Raman Spectroscopy

Residual stress measurement in a metal microdevice by micro Raman spectroscopy

2017 ◽  
Vol 27 (10) ◽  
pp. 105014 ◽  
Author(s):  
Chang Song ◽  
Liqun Du ◽  
Leijie Qi ◽  
Yu Li ◽  
Xiaojun Li ◽  
...  
Keyword(s):  
Residual Stress ◽  
Raman Spectroscopy ◽  
Stress Measurement ◽  
Residual Stress Measurement ◽  
Micro Raman Spectroscopy

Micro-Raman spectroscopy stress measurement method for porous silicon film

2010 ◽  
Vol 48 (11) ◽  
pp. 1119-1125 ◽  
Author(s):  
Qiu Li ◽  
Wei Qiu ◽  
Haoyun Tan ◽  
Jiangang Guo ◽  
Yilan Kang
Keyword(s):  
Raman Spectroscopy ◽  
Porous Silicon ◽  
Measurement Method ◽  
Stress Measurement ◽  
Silicon Film ◽  
Micro Raman Spectroscopy
Sign in / Sign up

Export Citation Format

Share Document