OS1310 Strain/Stress Measurement for Single Crystal Si by Polarized Micro-Raman Spectroscopy

2012 ◽  
Vol 2012 (0) ◽  
pp. _OS1310-1_-_OS1310-3_
Author(s):  
Takahiro SUZUKI ◽  
Takuto ICHIKAWA ◽  
Hirohisa KIMACHI
Keyword(s):  
Raman Spectroscopy ◽  
Single Crystal ◽  
Stress Measurement ◽  
Micro Raman Spectroscopy ◽  
Strain Stress

Local strain evaluation of single crystal Si pillar by micro Raman spectroscopy and photoluminescence

2008 ◽  
Vol 517 (1) ◽  
pp. 31-33 ◽  
Author(s):  
Dong Wang ◽  
Hiroshi Nakashima ◽  
Masanori Tanaka ◽  
Taizoh Sadoh ◽  
Masanobu Miyao ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Single Crystal ◽  
Local Strain ◽  
Micro Raman Spectroscopy

Vibrational dynamics of single-crystal YVO4studied by polarized micro-Raman spectroscopy andab initiocalculations

2012 ◽  
Vol 86 (21) ◽  
Author(s):  
Andrea Sanson ◽  
Marco Giarola ◽  
Barbara Rossi ◽  
Gino Mariotto ◽  
Enzo Cazzanelli ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Single Crystal ◽  
Vibrational Dynamics ◽  
Micro Raman Spectroscopy

Study of field-induced phase transitions in 0.68PbMg1/3Nb2/3O3–0.32PbTiO3 relaxor single crystal by polarized micro-Raman spectroscopy

2014 ◽  
Vol 105 (10) ◽  
pp. 102909 ◽  
Author(s):  
Chao Chen ◽  
Hao Deng ◽  
Xiaobing Li ◽  
Haiwu Zhang ◽  
Ting Huang ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Phase Transitions ◽  
Single Crystal ◽  
Micro Raman Spectroscopy

Residual stress measurement in a metal microdevice by micro Raman spectroscopy

2017 ◽  
Vol 27 (10) ◽  
pp. 105014 ◽  
Author(s):  
Chang Song ◽  
Liqun Du ◽  
Leijie Qi ◽  
Yu Li ◽  
Xiaojun Li ◽  
...  
Keyword(s):  
Residual Stress ◽  
Raman Spectroscopy ◽  
Stress Measurement ◽  
Residual Stress Measurement ◽  
Micro Raman Spectroscopy
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