Defect and Structure Analysis of n+- and p+-type Porous Silicon by the Electron Paramagnetic Resonance Technique

Author(s):  
H. J. Bardeleben ◽  
D. Stievenard ◽  
A. Grosman ◽  
C. Ortega ◽  
J. Siejka
1996 ◽  
Vol 276 (1-2) ◽  
pp. 241-243 ◽  
Author(s):  
J.L Cantin ◽  
M Schoisswohl ◽  
H.J von Bardeleben ◽  
N.Hadj Zoubir ◽  
M Vergnat

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