Towards a Skyrme-Hartree-Fock-Bogolyubov Mass Formula

2001 ◽  
pp. 433-437
Author(s):  
M. Samyn ◽  
S. Goriely ◽  
P.-H. Heenen
Keyword(s):  
Mass Formula ◽  
Hartree Fock

Hartree-Fock Approach to Mass Formula

1980 ◽  
pp. 341-348
Author(s):  
J. M. Pearson ◽  
M. Farine ◽  
J. Côté ◽  
B. Rouben ◽  
G. Saunier
Keyword(s):  
Mass Formula ◽  
Hartree Fock

A Hartree-Fock nuclear mass formula

2003 ◽  
pp. 15-18
Author(s):  
J. M. Pearson ◽  
S. Goriely ◽  
M. Samyn
Keyword(s):  
Mass Formula ◽  
Nuclear Mass ◽  
Hartree Fock

A Hartree-Fock nuclear mass formula

2002 ◽  
Vol 15 (1-2) ◽  
pp. 13-16 ◽  
Author(s):  
J.M. Pearson ◽  
S. Goriely ◽  
M. Samyn
Keyword(s):  
Mass Formula ◽  
Nuclear Mass ◽  
Hartree Fock

Nuclear mass formula via an approximation to the Hartree—Fock method

1995 ◽  
Vol 61 (1) ◽  
pp. 127-176 ◽  
Author(s):  
Y. Aboussir ◽  
J.M. Pearson ◽  
A.K. Dutta ◽  
F. Tondeur
Keyword(s):  
Mass Formula ◽  
Nuclear Mass ◽  
Hartree Fock

Towards a Hartree-Fock mass formula

2000 ◽  
Vol 62 (2) ◽  
Author(s):  
F. Tondeur ◽  
S. Goriely ◽  
J. M. Pearson ◽  
M. Onsi
Keyword(s):  
Mass Formula ◽  
Hartree Fock

TOWARDS A HARTREE-FOCK MASS FORMULA

2001 ◽  
Author(s):  
J. M. PEARSON ◽  
M. ONSI ◽  
S. GORIELY ◽  
F. TONDEUR ◽  
M. FARINE
Keyword(s):  
Mass Formula ◽  
Hartree Fock

A Hartree–Fock–Bogoliubov mass formula

2002 ◽  
Vol 700 (1-2) ◽  
pp. 142-156 ◽  
Author(s):  
M. Samyn ◽  
S. Goriely ◽  
P.-H. Heenen ◽  
J.M. Pearson ◽  
F. Tondeur
Keyword(s):  
Mass Formula ◽  
Hartree Fock

Study of charge transfer in FeTi

1983 ◽  
Vol 41 ◽  
pp. 296-297
Author(s):  
J. Taft∅
Keyword(s):  
Charge Transfer ◽  
Charge Distribution ◽  
Electron Scattering ◽  
Periodic System ◽  
Electron Distribution ◽  
Scattering Amplitude ◽  
Transition Elements ◽  
Hartree Fock ◽  
Cscl Structure ◽  
The Right

It is well known that for reflections corresponding to large interplanar spacings (i.e., sin θ/λ small), the electron scattering amplitude, f, is sensitive to the ionicity and to the charge distribution around the atoms. We have used this in order to obtain information about the charge distribution in FeTi, which is a candidate for storage of hydrogen. Our goal is to study the changes in electron distribution in the presence of hydrogen, and also the ionicity of hydrogen in metals, but so far our study has been limited to pure FeTi. FeTi has the CsCl structure and thus Fe and Ti scatter with a phase difference of π into the 100-ref lections. Because Fe (Z = 26) is higher in the periodic system than Ti (Z = 22), an immediate “guess” would be that Fe has a larger scattering amplitude than Ti. However, relativistic Hartree-Fock calculations show that the opposite is the case for the 100-reflection. An explanation for this may be sought in the stronger localization of the d-electrons of the first row transition elements when moving to the right in the periodic table. The tabulated difference between fTi (100) and ffe (100) is small, however, and based on the values of the scattering amplitude for isolated atoms, the kinematical intensity of the 100-reflection is only 5.10-4 of the intensity of the 200-reflection.

Single Atom Image Contrast in Fixed Beam Dark Field Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 366-367
Author(s):  
Wah Chi
Keyword(s):  
Scattering Amplitude ◽  
Present Report ◽  
Dark Field ◽  
Image Contrast ◽  
Single Atom ◽  
Optical Theorem ◽  
Hartree Fock ◽  
Heavy Atoms ◽  
Beam Stop ◽  
Fixed Beam

Resolution and contrast are the important factors to determine the feasibility of imaging single heavy atoms on a thin substrate in an electron microscope. The present report compares the atom image characteristics in different modes of fixed beam dark field microscopy including the ideal beam stop (IBS), a wire beam stop (WBS), tilted illumination (Tl) and a displaced aperture (DA). Image contrast between one Hg and a column of linearly aligned carbon atoms (representing the substrate), are also discussed. The assumptions in the present calculations are perfectly coherent illumination, atom object is represented by spherically symmetric potential derived from Relativistic Hartree Fock Slater wave functions, phase grating approximation is used to evaluate the complex scattering amplitude, inelastic scattering is ignored, phase distortion is solely due to defocus and spherical abberation, and total elastic scattering cross section is evaluated by the Optical Theorem. The atom image intensities are presented in a Z-modulation display, and the details of calculation are described elsewhere.

Spatially Resolved Photoelectron Spectroscopy: Recent Progress and Future Plans

1990 ◽  
Vol 48 (2) ◽  
pp. 388-389
Author(s):  
A. M. Bradshaw
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Reactivity ◽  
Target Material ◽  
Orbital Energy ◽  
Light Sources ◽  
Analytical Technique ◽  
Hartree Fock ◽  
Spatially Resolved ◽  
Koopmans Theorem ◽  
Surface Analytical Technique

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).

Sign in / Sign up

Export Citation Format

Share Document