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X-Ray Diffraction Line Profile Analysis of ZnO Thin Films Deposited on Al-SiO2-Si Substrates
Science and Technology of Electroceramic Thin Films
◽
10.1007/978-94-017-2950-5_24
◽
1995
◽
pp. 327-334
◽
Cited By ~ 1
Author(s):
P. Sutta
◽
Q. Jackuliak
◽
V. Tvarozek
◽
I. Novotny
Keyword(s):
Thin Films
◽
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Zno Thin Films
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Si Substrates
◽
Diffraction Line Profile
Download Full-text
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References
Determination of Structure Characteristics of Heteroepitaxially Grown Thin Films Through X-Ray Diffraction Line Profile Analysis
Heterostructure Epitaxy and Devices — HEAD’97
◽
10.1007/978-94-011-5012-5_60
◽
1998
◽
pp. 301-304
Author(s):
P. Šutta
Keyword(s):
Thin Films
◽
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Structure Characteristics
◽
Diffraction Line Profile
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X-ray diffraction line profile analysis of KBr thin films
Applied Physics A
◽
10.1007/s00339-016-0293-3
◽
2016
◽
Vol 122
(8)
◽
Cited By ~ 18
Author(s):
R. Rai
◽
Triloki Triloki
◽
B. K. Singh
Keyword(s):
Thin Films
◽
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Diffraction Line Profile
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X-ray Diffraction Line Profile Analysis of Undoped and Se-Doped SnS Thin Films Using Scherrer’s, Williamson–Hall and Size–Strain Plot Methods
Journal of Electronic Materials
◽
10.1007/s11664-018-6791-7
◽
2018
◽
Vol 48
(2)
◽
pp. 1294-1309
◽
Cited By ~ 8
Author(s):
Hosein Kafashan
Keyword(s):
Thin Films
◽
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Diffraction Line Profile
◽
Sns Thin Films
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Microhardness evaluation of Cu–Ni multilayered films by X-ray diffraction line profile analysis
Thin Solid Films
◽
10.1016/s0040-6090(98)00366-6
◽
1998
◽
Vol 324
(1-2)
◽
pp. 162-164
◽
Cited By ~ 14
Author(s):
F.L Shan
◽
Z.M Gao
◽
Y.M Wang
Keyword(s):
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
Multilayered Films
◽
X Ray
◽
Diffraction Line Profile
Download Full-text
Appendix: characterisation of defect structure by x-ray diffraction line profile analysis
Defect Structure in Nanomaterials
◽
10.1533/9780857096142.333
◽
2012
◽
pp. 333-353
Keyword(s):
Line Profile
◽
Defect Structure
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Diffraction Line Profile
Download Full-text
X-ray diffraction line profile analysis of diffusional homogenization in powder blends
Journal of Materials Science
◽
10.1007/bf00548730
◽
1978
◽
Vol 13
(8)
◽
pp. 1671-1679
◽
Cited By ~ 5
Author(s):
R. Delhez
◽
E. J. Mittemeijer
◽
E. A. van den Bergen
Keyword(s):
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Diffraction Line Profile
◽
Powder Blends
◽
Diffusional Homogenization
Download Full-text
X-ray diffraction line profile analysis of mechanically alloyed nanocrystalline YSZ
Journal of Physics D Applied Physics
◽
10.1088/0022-3727/41/4/045408
◽
2008
◽
Vol 41
(4)
◽
pp. 045408
◽
Cited By ~ 9
Author(s):
O J Durá
◽
M A López de la Torre
Keyword(s):
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
Mechanically Alloyed
◽
X Ray
◽
Diffraction Line Profile
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X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material
Bulletin of Materials Science
◽
10.1007/bf02708487
◽
2004
◽
Vol 27
(1)
◽
pp. 59-67
◽
Cited By ~ 23
Author(s):
K. Kapoor
◽
D. Lahiri
◽
S. V. R. Rao
◽
T. Sanyal
◽
B. P. Kashyap
Keyword(s):
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Diffraction Line Profile
Download Full-text
Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis
Materials Science Forum
◽
10.4028/www.scientific.net/msf.378-381.753
◽
2001
◽
Vol 378-381
◽
pp. 753-758
Author(s):
Alexandre Boulle
◽
C. Legrand
◽
P. Thomas
◽
R. Guinebretière
◽
J.P. Mercurio
◽
...
Keyword(s):
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
X Ray
◽
Diffraction Line Profile
◽
Stacking Disorder
Download Full-text
Lattice imperfection studies in polycrystalline materials by x-ray diffraction line-profile analysis
Pramana
◽
10.1007/bf02894766
◽
1984
◽
Vol 23
(6)
◽
pp. 721-744
◽
Cited By ~ 17
Author(s):
M De
◽
S P Sen Gupta
Keyword(s):
Line Profile
◽
Profile Analysis
◽
Diffraction Line
◽
Polycrystalline Materials
◽
Line Profile Analysis
◽
X Ray Diffraction
◽
Lattice Imperfection
◽
X Ray
◽
Diffraction Line Profile
Download Full-text
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