X-ray Diffraction Line Profile Analysis of Undoped and Se-Doped SnS Thin Films Using Scherrer’s, Williamson–Hall and Size–Strain Plot Methods

2018 ◽  
Vol 48 (2) ◽  
pp. 1294-1309 ◽  
Author(s):  
Hosein Kafashan
Keyword(s):  
Thin Films ◽  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Sns Thin Films

scholarly journals X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis

2001 ◽  
Vol 378-381 ◽  
pp. 753-758
Author(s):  
Alexandre Boulle ◽  
C. Legrand ◽  
P. Thomas ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Stacking Disorder
Sign in / Sign up

Export Citation Format

Share Document